{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,6]],"date-time":"2025-12-06T16:47:08Z","timestamp":1765039628136,"version":"3.37.3"},"reference-count":18,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,5,16]],"date-time":"2022-05-16T00:00:00Z","timestamp":1652659200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,5,16]],"date-time":"2022-05-16T00:00:00Z","timestamp":1652659200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100011311","name":"State Key Laboratory of Industrial Control Technology","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100011311","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004835","name":"Zhejiang University","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100004835","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,5,16]]},"DOI":"10.1109\/i2mtc48687.2022.9806675","type":"proceedings-article","created":{"date-parts":[[2022,6,30]],"date-time":"2022-06-30T19:42:14Z","timestamp":1656618134000},"page":"1-6","source":"Crossref","is-referenced-by-count":1,"title":["Vertices Independent Component Analysis-based Status Monitoring Strategy for Processes with Uncertainties"],"prefix":"10.1109","author":[{"given":"Sijia","family":"Wang","sequence":"first","affiliation":[{"name":"Tianjin University,School of Electrical and Information Engineering,Tianjin,China"}]},{"given":"Shumei","family":"Zhang","sequence":"additional","affiliation":[{"name":"Tianjin University,School of Electrical and Information Engineering,Tianjin,China"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1002\/cplx.21625"},{"key":"ref11","first-page":"5","article-title":"Extension de l’analyse en composantes principales à des données de type intervalle","volume":"45","author":"cazes","year":"1997","journal-title":"Revue de Statistique Appliquée"},{"key":"ref12","article-title":"Extension des méthodes d’analyse factorielle a des données de type intervalle","author":"chouakria","year":"1998","journal-title":"Ph D Dissertation"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/978-4-431-66996-8_74"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2012.01.018"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/72.761722"},{"key":"ref16","doi-asserted-by":"crossref","first-page":"5072","DOI":"10.1021\/acs.iecr.9b06554","article-title":"Abnormal Condition Identification via OVR-IRBF-NN for the Process Industry with Imprecise Data and Semantic Information","volume":"59","author":"yuan","year":"2020","journal-title":"Industrial & Engineering Chemistry Research"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2018.2810822"},{"key":"ref18","doi-asserted-by":"crossref","first-page":"2022","DOI":"10.1002\/aic.690480916","article-title":"Pattern Matching in Historical Data","volume":"48","author":"johannesmeyer","year":"2002","journal-title":"AIChE Journal"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.psep.2013.11.003"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1002\/aic.16048"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3004681"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2900143"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.jfranklin.2021.07.041"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2019.09.075"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2016.2642659"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2019.03.061"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2021.05.007"}],"event":{"name":"2022 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2022,5,16]]},"location":"Ottawa, ON, Canada","end":{"date-parts":[[2022,5,19]]}},"container-title":["2022 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9806445\/9806446\/09806675.pdf?arnumber=9806675","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,25]],"date-time":"2022-07-25T20:17:01Z","timestamp":1658780221000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9806675\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,5,16]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/i2mtc48687.2022.9806675","relation":{},"subject":[],"published":{"date-parts":[[2022,5,16]]}}}