{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T01:18:55Z","timestamp":1740100735793,"version":"3.37.3"},"reference-count":23,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,5,16]],"date-time":"2022-05-16T00:00:00Z","timestamp":1652659200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,5,16]],"date-time":"2022-05-16T00:00:00Z","timestamp":1652659200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,5,16]]},"DOI":"10.1109\/i2mtc48687.2022.9806697","type":"proceedings-article","created":{"date-parts":[[2022,6,30]],"date-time":"2022-06-30T19:42:14Z","timestamp":1656618134000},"page":"1-5","source":"Crossref","is-referenced-by-count":3,"title":["Parameter Matching Method for the Measurement of Two-dimensional Pulse Streams Signal"],"prefix":"10.1109","author":[{"given":"Shuangxing","family":"Yun","sequence":"first","affiliation":[{"name":"Harbin Institute of Technology,School of Electronics and Information Engineering,Harbin,P.R. China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ning","family":"Fu","sequence":"additional","affiliation":[{"name":"Harbin Institute of Technology,School of Electronics and Information Engineering,Harbin,P.R. China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Liyan","family":"Qiao","sequence":"additional","affiliation":[{"name":"Harbin Institute of Technology,School of Electronics and Information Engineering,Harbin,P.R. China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/MSP.2007.914998"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2020.3041089"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2010.2046590"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2011.2113124"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.2977742"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2018.2791973"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2895438"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2755998"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2007.894259"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/CONECCT.2013.6469313"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2665983"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2016.2625274"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2012.2189391"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2019.2928982"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2020.3022816"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2017.2742983"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/5.843002"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/PROC.1984.12998"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2021.3112914"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2017.2669900"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2826182"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1561\/2200000016"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1007\/BF02648881"}],"event":{"name":"2022 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2022,5,16]]},"location":"Ottawa, ON, Canada","end":{"date-parts":[[2022,5,19]]}},"container-title":["2022 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9806445\/9806446\/09806697.pdf?arnumber=9806697","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,25]],"date-time":"2022-07-25T20:17:43Z","timestamp":1658780263000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9806697\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,5,16]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/i2mtc48687.2022.9806697","relation":{},"subject":[],"published":{"date-parts":[[2022,5,16]]}}}