{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T01:18:54Z","timestamp":1740100734017,"version":"3.37.3"},"reference-count":18,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,5,16]],"date-time":"2022-05-16T00:00:00Z","timestamp":1652659200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,5,16]],"date-time":"2022-05-16T00:00:00Z","timestamp":1652659200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100012226","name":"Fundamental Research Funds for the Central Universities","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100012226","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,5,16]]},"DOI":"10.1109\/i2mtc48687.2022.9806711","type":"proceedings-article","created":{"date-parts":[[2022,6,30]],"date-time":"2022-06-30T19:42:14Z","timestamp":1656618134000},"page":"1-5","source":"Crossref","is-referenced-by-count":0,"title":["Measurement of tube thickness using eddy current testing based on the modified integration range"],"prefix":"10.1109","author":[{"given":"Pu","family":"Huang","sequence":"first","affiliation":[{"name":"Beihang University,School of Instrumentation and Optoelectronic Engineering,Beijing,China,100191"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hang","family":"Pu","sequence":"additional","affiliation":[{"name":"Beihang University,School of Instrumentation and Optoelectronic Engineering,Beijing,China,100191"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lijun","family":"Xu","sequence":"additional","affiliation":[{"name":"Beihang University,School of Instrumentation and Optoelectronic Engineering,Beijing,China,100191"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yuedong","family":"Xie","sequence":"additional","affiliation":[{"name":"Beihang University,School of Instrumentation and Optoelectronic Engineering,Beijing,China,100191"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2014.07.005"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1080\/10589759.2020.1714614"},{"key":"ref12","doi-asserted-by":"crossref","first-page":"103","DOI":"10.1016\/j.ndteint.2006.10.006","article-title":"Analytical modelling in low-frequency electromagnetic measurements of steel casing properties","volume":"40","author":"darko","year":"2007","journal-title":"NDT&E"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.2997525"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2020.108306"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1080\/09349840590961670"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1080\/09349840209409708"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2020.2981435"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1063\/1.1656680"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2016.04.038"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.4283\/JMAG.2011.16.1.036"},{"key":"ref6","first-page":"2773","article-title":"A Novel Compensation Algorithm for Thickness Measurement Immune to Lift-Off Variations Using Eddy Current Method","volume":"65","author":"lu","year":"2016"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.2987413"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2013.2247713"},{"key":"ref7","first-page":"306","article-title":"Fast Measurement of the Coating Thickness and Conductivity Using Eddy Currents and Plane Wave Approximation","volume":"21","author":"xu","year":"2021","journal-title":"IEEE Sensors Journal"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.ultras.2018.05.006"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2021.3059899"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2008.09.006"}],"event":{"name":"2022 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2022,5,16]]},"location":"Ottawa, ON, Canada","end":{"date-parts":[[2022,5,19]]}},"container-title":["2022 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9806445\/9806446\/09806711.pdf?arnumber=9806711","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,25]],"date-time":"2022-07-25T20:17:22Z","timestamp":1658780242000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9806711\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,5,16]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/i2mtc48687.2022.9806711","relation":{},"subject":[],"published":{"date-parts":[[2022,5,16]]}}}