{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,28]],"date-time":"2025-10-28T10:54:59Z","timestamp":1761648899993,"version":"3.28.0"},"reference-count":22,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,5,17]],"date-time":"2021-05-17T00:00:00Z","timestamp":1621209600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,5,17]],"date-time":"2021-05-17T00:00:00Z","timestamp":1621209600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,5,17]],"date-time":"2021-05-17T00:00:00Z","timestamp":1621209600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,5,17]]},"DOI":"10.1109\/i2mtc50364.2021.9459795","type":"proceedings-article","created":{"date-parts":[[2021,6,28]],"date-time":"2021-06-28T18:17:46Z","timestamp":1624904266000},"page":"1-6","source":"Crossref","is-referenced-by-count":9,"title":["Chipless RFID Tags as Microwave Sensors for Delamination Detection in Layered Structures"],"prefix":"10.1109","author":[{"given":"Katelyn","family":"Brinker","sequence":"first","affiliation":[]},{"given":"Reza","family":"Zoughi","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/IMaRC.2015.7411449"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/APUSNCURSINRSM.2018.8609386"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2018.8409670"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/SENSORS43011.2019.8956618"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/AMS48904.2020.9059330"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/RWS45077.2020.9050047"},{"key":"ref16","article-title":"Utilization of Microwave Imaging for Chipless RFID Tag Reading and Verification - A Hybrid Approach","author":"brinker","year":"2020","journal-title":"Antenna Measurements and Techniques Association (AMTA) symposium"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2938131"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC43012.2020.9129085"},{"key":"ref19","article-title":"Passively-Coded Embedded Microwave Sensors for Materials Characterization and Structural Health Monitoring (SHM)","volume":"13896483","author":"brinker","year":"2019","journal-title":"Master of Science Electrical Engineering Master's Electrical and Computer Engineering Missouri University of Science and Technology"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2015.7151444"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1061\/(ASCE)0899-1561(2004)16:6(540)"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/22.277431"},{"journal-title":"Delamination Detection of FRP Sheet Reinforced Concrete Using Microstrip Patch Antenna","year":"2007","author":"rhim","key":"ref5"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/MMM.2019.2922118"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1098\/rsta.2019.0585"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.909497"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2192355"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4614-2095-8"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2013.2291952"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2008.2009133"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/JRFID.2020.3034483"}],"event":{"name":"2021 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2021,5,17]]},"location":"Glasgow, United Kingdom","end":{"date-parts":[[2021,5,20]]}},"container-title":["2021 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9459717\/9459787\/09459795.pdf?arnumber=9459795","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T11:42:53Z","timestamp":1652182973000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9459795\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,5,17]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/i2mtc50364.2021.9459795","relation":{},"subject":[],"published":{"date-parts":[[2021,5,17]]}}}