{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,20]],"date-time":"2026-01-20T07:15:49Z","timestamp":1768893349410,"version":"3.49.0"},"reference-count":22,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,5,17]],"date-time":"2021-05-17T00:00:00Z","timestamp":1621209600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,5,17]],"date-time":"2021-05-17T00:00:00Z","timestamp":1621209600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100004909","name":"UFRGS","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100004909","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,5,17]]},"DOI":"10.1109\/i2mtc50364.2021.9459804","type":"proceedings-article","created":{"date-parts":[[2021,6,28]],"date-time":"2021-06-28T22:17:46Z","timestamp":1624918666000},"page":"1-5","source":"Crossref","is-referenced-by-count":1,"title":["A Neutron Generator Testing Platform for the Radiation Analysis of SRAM-based FPGAs"],"prefix":"10.1109","author":[{"given":"L.","family":"Bozzoli","sequence":"first","affiliation":[{"name":"Politecnico di Torino,Dipartimento di Automatica e Informatica,Torino,Italy"}]},{"given":"C.","family":"De Sio","sequence":"additional","affiliation":[{"name":"Politecnico di Torino,Dipartimento di Automatica e Informatica,Torino,Italy"}]},{"given":"B.","family":"Du","sequence":"additional","affiliation":[{"name":"Politecnico di Torino,Dipartimento di Automatica e Informatica,Torino,Italy"}]},{"given":"L.","family":"Sterpone","sequence":"additional","affiliation":[{"name":"Politecnico di Torino,Dipartimento di Automatica e Informatica,Torino,Italy"}]}],"member":"263","reference":[{"key":"ref10","year":"2012","journal-title":"Neutron Generators for Analytical Purposes Radiation Technology"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.phpro.2014.11.029"},{"key":"ref12","year":"2018","journal-title":"7 Series FPGAs Configuration User Guide UG470 (v1 11)"},{"key":"ref13","year":"2011","journal-title":"UG702 (V12 3) Partial Reconfiguration User Guide"},{"key":"ref14","first-page":"216","article-title":"Correcting single-event upsets through Virtex partial configuration","author":"carmichael","year":"2000","journal-title":"Xilinx Corporation"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2015.2489601"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2003.821411"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2003.821791"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2014.6873681"},{"key":"ref19","article-title":"Revisions to the JEDEC JESD89 standard on soft error management","author":"slayman","year":"0"},{"key":"ref4","article-title":"The Cibola flight experiment","author":"quinn","year":"2014","journal-title":"ACM Trans Reconfig Technol Syst"},{"key":"ref3","volume":"7","author":"dehon","year":"0","journal-title":"Reconfigurable Computing The Theory and Practice of FPGA - Based Computation ser The Morgan Kaufmann Series in Systems on Silicon"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2014.2302432"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2019.2915207"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2017.7969976"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2018.07.135"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/DASC.2005.1563418"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2015.2404212"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2020.3006997"},{"key":"ref20","year":"2016","journal-title":"AXI HWICAP v3 0 LogiCORE IP Product Guide Vivado Design Suite PG134"},{"key":"ref22","year":"0"},{"key":"ref21","year":"0"}],"event":{"name":"2021 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","location":"Glasgow, United Kingdom","start":{"date-parts":[[2021,5,17]]},"end":{"date-parts":[[2021,5,20]]}},"container-title":["2021 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9459717\/9459787\/09459804.pdf?arnumber=9459804","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,8,2]],"date-time":"2022-08-02T23:17:06Z","timestamp":1659482226000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9459804\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,5,17]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/i2mtc50364.2021.9459804","relation":{},"subject":[],"published":{"date-parts":[[2021,5,17]]}}}