{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T18:14:16Z","timestamp":1730225656040,"version":"3.28.0"},"reference-count":24,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,5,17]],"date-time":"2021-05-17T00:00:00Z","timestamp":1621209600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,5,17]],"date-time":"2021-05-17T00:00:00Z","timestamp":1621209600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,5,17]],"date-time":"2021-05-17T00:00:00Z","timestamp":1621209600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,5,17]]},"DOI":"10.1109\/i2mtc50364.2021.9459870","type":"proceedings-article","created":{"date-parts":[[2021,6,29]],"date-time":"2021-06-29T16:13:12Z","timestamp":1624983192000},"page":"1-5","source":"Crossref","is-referenced-by-count":6,"title":["Frequency span optimization for asymmetric resonance curve fitting"],"prefix":"10.1109","author":[{"given":"Kostiantyn","family":"Torokhtii","sequence":"first","affiliation":[]},{"given":"Andrea","family":"Alimenti","sequence":"additional","affiliation":[]},{"given":"Nicola","family":"Pompeo","sequence":"additional","affiliation":[]},{"given":"Enrico","family":"Silva","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","first-page":"94","article-title":"Low-Cost Vector Network Analyzer for Communication Devices Testing - Brief Review","volume":"2","author":"you","year":"2017","journal-title":"International Journal of Advances in Microwave Technology"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1049\/cp.2017.0225"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/MWSYM.2008.4633181"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1063\/1.368498"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1088\/1742-6596\/1065\/5\/052027"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2017.7969903"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.2478\/msr-2014-0022"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TASC.2018.2797307"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1364\/OE.21.017751"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1137\/0111030"},{"key":"ref4","first-page":"1","article-title":"A New Dielectric Analyzer for Rapid Measurement of Microwave Substrates up to 6 GHz","author":"schultz","year":"2018","journal-title":"Proc of AMTA 2018 Williams-burg"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2018.2857514"},{"year":"0","key":"ref6"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-019-12550-6"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/ab0e65"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TASC.2019.2892584"},{"journal-title":"Microwave Electronics","year":"2005","author":"chen","key":"ref2"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TPS.2008.927165"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2015.07.058"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.2172\/6997568"},{"journal-title":"ShockLine Compact Vector Network Analyzers MS46122B TDS PN 11410–00995 Rev L Anritsu Company","year":"2019","key":"ref22"},{"journal-title":"SciPy 1 0-Fundamental Algorithms for Scientific Computing in Python","year":"2019","author":"virtanen","key":"ref21"},{"journal-title":"PicoVNA 106 Datasheet Pico Technology Ltd","year":"2019","key":"ref24"},{"journal-title":"How to use the MegiQ VNA0440(e)-VNA0460(e) Vector Network Analyzers","year":"2017","key":"ref23"}],"event":{"name":"2021 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2021,5,17]]},"location":"Glasgow, United Kingdom","end":{"date-parts":[[2021,5,20]]}},"container-title":["2021 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9459717\/9459787\/09459870.pdf?arnumber=9459870","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T11:42:50Z","timestamp":1652182970000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9459870\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,5,17]]},"references-count":24,"URL":"https:\/\/doi.org\/10.1109\/i2mtc50364.2021.9459870","relation":{},"subject":[],"published":{"date-parts":[[2021,5,17]]}}}