{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,8,30]],"date-time":"2024-08-30T11:42:07Z","timestamp":1725018127489},"reference-count":21,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,5,17]],"date-time":"2021-05-17T00:00:00Z","timestamp":1621209600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,5,17]],"date-time":"2021-05-17T00:00:00Z","timestamp":1621209600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,5,17]]},"DOI":"10.1109\/i2mtc50364.2021.9460032","type":"proceedings-article","created":{"date-parts":[[2021,6,28]],"date-time":"2021-06-28T22:17:46Z","timestamp":1624918666000},"page":"1-6","source":"Crossref","is-referenced-by-count":3,"title":["Impedance characterization of a QCM-based measurement system in liquid media"],"prefix":"10.1109","author":[{"given":"Ada","family":"Fort","sequence":"first","affiliation":[{"name":"University of Siena,D.I.I.S.M., Dipartimento di Ingegneria dell'Informazione e Scienze Matematiche,Siena,Italy,53100"}]},{"given":"Enza","family":"Panzardi","sequence":"additional","affiliation":[{"name":"University of Siena,D.I.I.S.M., Dipartimento di Ingegneria dell'Informazione e Scienze Matematiche,Siena,Italy,53100"}]},{"given":"Pietro","family":"Vaccarella","sequence":"additional","affiliation":[{"name":"University of Siena,D.I.I.S.M., Dipartimento di Ingegneria dell'Informazione e Scienze Matematiche,Siena,Italy,53100"}]},{"given":"Valerio","family":"Vignoli","sequence":"additional","affiliation":[{"name":"University of Siena,D.I.I.S.M., Dipartimento di Ingegneria dell'Informazione e Scienze Matematiche,Siena,Italy,53100"}]},{"given":"Marco","family":"Mugnaini","sequence":"additional","affiliation":[{"name":"University of Siena,D.I.I.S.M., Dipartimento di Ingegneria dell'Informazione e Scienze Matematiche,Siena,Italy,53100"}]},{"given":"Anna","family":"Lo Grasso","sequence":"additional","affiliation":[{"name":"University of Siena,D.I.I.S.M., Dipartimento di Ingegneria dell'Informazione e Scienze Matematiche,Siena,Italy,53100"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2785118"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/b978-0-12-814130-4.00007-5"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2929280"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2019.2916102"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1002\/jmr.826"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3008987"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1021\/ac951203m"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1155\/2016\/7580483"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/S0003-2670(00)82721-X"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/0925-4005(95)85010-4"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.3390\/s120810604"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2004.841450"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.5194\/jsss-6-341-2017"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/SAS.2019.8705996"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.3390\/s8010370"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.3390\/s17122799"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1088\/1757-899X\/546\/4\/042040"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/JRPROC.1928.221466"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1021\/ac00020a015"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.3390\/s17071476"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/24\/8\/085301"}],"event":{"name":"2021 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2021,5,17]]},"location":"Glasgow, United Kingdom","end":{"date-parts":[[2021,5,20]]}},"container-title":["2021 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9459717\/9459787\/09460032.pdf?arnumber=9460032","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,8,30]],"date-time":"2024-08-30T10:28:42Z","timestamp":1725013722000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9460032\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,5,17]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/i2mtc50364.2021.9460032","relation":{},"subject":[],"published":{"date-parts":[[2021,5,17]]}}}