{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T20:19:59Z","timestamp":1725653999676},"reference-count":17,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,5,17]],"date-time":"2021-05-17T00:00:00Z","timestamp":1621209600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,5,17]],"date-time":"2021-05-17T00:00:00Z","timestamp":1621209600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,5,17]],"date-time":"2021-05-17T00:00:00Z","timestamp":1621209600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,5,17]]},"DOI":"10.1109\/i2mtc50364.2021.9460056","type":"proceedings-article","created":{"date-parts":[[2021,6,28]],"date-time":"2021-06-28T22:17:46Z","timestamp":1624918666000},"page":"1-6","source":"Crossref","is-referenced-by-count":2,"title":["Fast Transient Harmonic Selective Extraction Based on Modulation-CDSC-SDFT"],"prefix":"10.1109","author":[{"given":"Jingwen","family":"Zhang","sequence":"first","affiliation":[]},{"given":"Zhenglei","family":"Wang","sequence":"additional","affiliation":[]},{"given":"Xiaotao","family":"Han","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/28.993175"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2002.802185"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2004.838643"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2162715"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2012.2214445"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2010.2091150"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/PEDES.2014.7041974"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/PEDES.2012.6484311"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/S0022-3093(02)01786-6"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MIA.2007.4283506"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/MSP.2010.938088"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IFEEC.2017.7992244"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2703138"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/MSP.2017.2718039"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1049\/piee.1969.0316"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2003.817609"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ICPES.2016.7584250"}],"event":{"name":"2021 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2021,5,17]]},"location":"Glasgow, United Kingdom","end":{"date-parts":[[2021,5,20]]}},"container-title":["2021 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9459717\/9459787\/09460056.pdf?arnumber=9460056","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T15:42:57Z","timestamp":1652197377000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9460056\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,5,17]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/i2mtc50364.2021.9460056","relation":{},"subject":[],"published":{"date-parts":[[2021,5,17]]}}}