{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T18:15:15Z","timestamp":1730225715605,"version":"3.28.0"},"reference-count":18,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,5,17]],"date-time":"2021-05-17T00:00:00Z","timestamp":1621209600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,5,17]],"date-time":"2021-05-17T00:00:00Z","timestamp":1621209600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,5,17]]},"DOI":"10.1109\/i2mtc50364.2021.9460067","type":"proceedings-article","created":{"date-parts":[[2021,6,28]],"date-time":"2021-06-28T18:17:46Z","timestamp":1624904266000},"page":"1-6","source":"Crossref","is-referenced-by-count":1,"title":["Femtocoulomb range triboelectric noise meter for super-low noise cables"],"prefix":"10.1109","author":[{"given":"Karl-Olov","family":"Wallin","sequence":"first","affiliation":[{"name":"Habia Cable AB,Söderfors,Sweden"}]},{"given":"Richard L.","family":"Andersson","sequence":"additional","affiliation":[{"name":"Habia Cable AB,Söderfors,Sweden"}]},{"given":"Per","family":"Angskog","sequence":"additional","affiliation":[{"name":"University of Gävle,Dept. of Electrical Engineering, Mathematics and Science,Gävle,Sweden"}]},{"given":"Jose","family":"Chilo","sequence":"additional","affiliation":[{"name":"University of Gävle,Dept. of Electrical Engineering, Mathematics and Science,Gävle,Sweden"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.elstat.2004.05.005"},{"journal-title":"Charge Measurement","year":"1999","author":"buchman","key":"ref11"},{"journal-title":"Electrical Measurements","year":"1952","author":"harris","key":"ref12"},{"journal-title":"Electrical Measurements and their Applications","year":"1969","author":"michels","key":"ref13"},{"journal-title":"Principles of Electronic Instrumentation","year":"1994","author":"diefenderfer","key":"ref14"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/MIPRO.2014.6859539"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/B978-075067844-5\/50132-6"},{"journal-title":"Low Level Measurements Handbook","year":"2016","key":"ref17"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/T-AIEE.1929.5055392"},{"key":"ref4","article-title":"Mechanism analysis and performance improvement of electrostatic noise in co-axial cable","author":"shi","year":"0","journal-title":"IEEE Industry Applications Society Annual Meeting"},{"key":"ref3","first-page":"5","article-title":"Lower-noise co-axial cable","volume":"11","author":"shi","year":"1990","journal-title":"Wire and Cable in China"},{"journal-title":"Analysis of microphonic noise genesis and mitigation in a Boron carbide detector system","year":"2015","author":"gordon","key":"ref6"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TBME.1975.324495"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.elstat.2007.05.008"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAS.2010.5669753"},{"key":"ref2","article-title":"Cable Testing and Condition Monitoring System for Nuclear Power Plants","author":"hashemian","year":"0","journal-title":"Future of Instrumentation International Workshop (FIIW)"},{"key":"ref1","article-title":"Low noise front-end amplifier design for medical ultrasound imaging applications","author":"sharma","year":"0","journal-title":"IEEE\/IFIP 20th International Conference on VLSI and System-on-Chip (VLSI-SoC)"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2014.2344500"}],"event":{"name":"2021 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2021,5,17]]},"location":"Glasgow, United Kingdom","end":{"date-parts":[[2021,5,20]]}},"container-title":["2021 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9459717\/9459787\/09460067.pdf?arnumber=9460067","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,8,2]],"date-time":"2022-08-02T19:16:50Z","timestamp":1659467810000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9460067\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,5,17]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/i2mtc50364.2021.9460067","relation":{},"subject":[],"published":{"date-parts":[[2021,5,17]]}}}