{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,27]],"date-time":"2026-04-27T10:15:16Z","timestamp":1777284916897,"version":"3.51.4"},"reference-count":17,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,5,22]],"date-time":"2023-05-22T00:00:00Z","timestamp":1684713600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,5,22]],"date-time":"2023-05-22T00:00:00Z","timestamp":1684713600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100006727","name":"Hochschuljubil\u00e4umsfonds of the city of Vienna, Austria","doi-asserted-by":"publisher","award":["H-260744\/2020"],"award-info":[{"award-number":["H-260744\/2020"]}],"id":[{"id":"10.13039\/501100006727","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,5,22]]},"DOI":"10.1109\/i2mtc53148.2023.10175937","type":"proceedings-article","created":{"date-parts":[[2023,7,13]],"date-time":"2023-07-13T17:19:10Z","timestamp":1689268750000},"page":"1-6","source":"Crossref","is-referenced-by-count":1,"title":["Robot-based measurement system for double-sided inspection of optical components"],"prefix":"10.1109","author":[{"given":"Daniel","family":"Wertjanz","sequence":"first","affiliation":[{"name":"Automation and Control Institute (ACIN), TU Wien,Group for Advanced Mechatronic Systems,Vienna,Austria,1040"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Thomas","family":"Kern","sequence":"additional","affiliation":[{"name":"Automation and Control Institute (ACIN), TU Wien,Group for Advanced Mechatronic Systems,Vienna,Austria,1040"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ernst","family":"Csencsics","sequence":"additional","affiliation":[{"name":"Automation and Control Institute (ACIN), TU Wien,Group for Advanced Mechatronic Systems,Vienna,Austria,1040"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Georg","family":"Schitter","sequence":"additional","affiliation":[{"name":"Automation and Control Institute (ACIN), TU Wien,Group for Advanced Mechatronic Systems,Vienna,Austria,1040"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3216679"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.precisioneng.2011.04.004"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/AIM52237.2022.9863321"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2022.3151959"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2021.3103040"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/MIM.2018.8573589"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.optcom.2012.09.076"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-017-1271-4"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/AIM.1999.803155"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1364\/JOSAA.394212"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.rcim.2007.11.001"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.precisioneng.2022.02.002"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/aa5c4f"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1364\/OE.381200"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1364\/OE.25.010704"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.cirp.2013.05.003"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1364\/OE.16.012958"}],"event":{"name":"2023 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","location":"Kuala Lumpur, Malaysia","start":{"date-parts":[[2023,5,22]]},"end":{"date-parts":[[2023,5,25]]}},"container-title":["2023 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10175865\/10175876\/10175937.pdf?arnumber=10175937","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,8,1]],"date-time":"2023-08-01T18:01:01Z","timestamp":1690912861000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10175937\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,5,22]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/i2mtc53148.2023.10175937","relation":{},"subject":[],"published":{"date-parts":[[2023,5,22]]}}}