{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T01:39:13Z","timestamp":1740101953559,"version":"3.37.3"},"reference-count":18,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,5,22]],"date-time":"2023-05-22T00:00:00Z","timestamp":1684713600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,5,22]],"date-time":"2023-05-22T00:00:00Z","timestamp":1684713600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100004377","name":"Hong Kong Polytechnic University","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100004377","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,5,22]]},"DOI":"10.1109\/i2mtc53148.2023.10175986","type":"proceedings-article","created":{"date-parts":[[2023,7,13]],"date-time":"2023-07-13T17:19:10Z","timestamp":1689268750000},"page":"01-05","source":"Crossref","is-referenced-by-count":1,"title":["Shock Tolerated Low Noise Analog Front-End for Milliamp Measurement on a Low Resistance Shunt"],"prefix":"10.1109","author":[{"given":"Shaoyang","family":"Wang","sequence":"first","affiliation":[{"name":"The Hong Kong Polytechnic University,Dept. of Building Environment and Energy Engineering,Hong Kong,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mingli","family":"Chen","sequence":"additional","affiliation":[{"name":"The Hong Kong Polytechnic University,Dept. of Building Environment and Energy Engineering,Hong Kong,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ya\u2013ping","family":"Du","sequence":"additional","affiliation":[{"name":"The Hong Kong Polytechnic University,Dept. of Building Environment and Energy Engineering,Hong Kong,China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"journal-title":"Applications Engineering Note AEN-0101 Designing With Caddock MP Series TO-Style Heat Sink Mountable Power Film Resistors","year":"2022","key":"ref13"},{"journal-title":"Understanding the Power Rating of Caddock MP9100 Resistors","year":"2022","key":"ref12"},{"key":"ref15","article-title":"Composite amplifiers","volume":"21","author":"williams","year":"1986","journal-title":"Linear Technology Corp Milpitas Calif"},{"journal-title":"LTO100 Series Datasheet","year":"2022","author":"vishay","key":"ref14"},{"journal-title":"Analysis and Measurement of Intrinsic Noise in Op Amp Circuits Part II Introduction to Opamp Noise","year":"2010","author":"kay","key":"ref11"},{"key":"ref10","article-title":"Linear circuit design handbook","author":"zumbahlen","year":"2011","journal-title":"Newnes"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6595\/aab6d5"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/INCET49848.2020.9154165"},{"journal-title":"Linear Technology","article-title":"DC511 - LT3439EFE Evaluation Kit Quick Start Guide","year":"2022","key":"ref17"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1049\/ip-g-2.1991.0011"},{"journal-title":"Power traces","article-title":"THM 6WI Series Datasheet","year":"2023","key":"ref18"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/19.69939"},{"key":"ref7","doi-asserted-by":"crossref","first-page":"114702","DOI":"10.1063\/1.3258197","article-title":"An ultralow noise preamplifier for low frequency noise measurements","volume":"80","author":"scandurra","year":"2009","journal-title":"Review of Scientific Instruments"},{"key":"ref9","article-title":"Common Mode and Instrumentation Amplifiers","author":"nash","year":"1998","journal-title":"Analog Devices Cambridge MA USA"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1134\/S0020441218030156"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2949127"},{"journal-title":"HBM “ISOBE5600 Series - User Manual","year":"2023","key":"ref6"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1029\/1999GL011053"}],"event":{"name":"2023 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2023,5,22]]},"location":"Kuala Lumpur, Malaysia","end":{"date-parts":[[2023,5,25]]}},"container-title":["2023 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10175865\/10175876\/10175986.pdf?arnumber=10175986","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,8,1]],"date-time":"2023-08-01T18:01:59Z","timestamp":1690912919000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10175986\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,5,22]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/i2mtc53148.2023.10175986","relation":{},"subject":[],"published":{"date-parts":[[2023,5,22]]}}}