{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T18:16:36Z","timestamp":1730225796986,"version":"3.28.0"},"reference-count":8,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,5,22]],"date-time":"2023-05-22T00:00:00Z","timestamp":1684713600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,5,22]],"date-time":"2023-05-22T00:00:00Z","timestamp":1684713600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,5,22]]},"DOI":"10.1109\/i2mtc53148.2023.10175997","type":"proceedings-article","created":{"date-parts":[[2023,7,13]],"date-time":"2023-07-13T17:19:10Z","timestamp":1689268750000},"page":"01-05","source":"Crossref","is-referenced-by-count":0,"title":["Corroborating Channel Gap Probe Measurements with an Optical Profiler"],"prefix":"10.1109","author":[{"given":"James A","family":"Smith","sequence":"first","affiliation":[{"name":"Measurment Sciences Idaho National Laboratory,Idaho Falls,USA"}]},{"given":"Jon","family":"Quinn","sequence":"additional","affiliation":[{"name":"High Precsion Measurement, Keyence,Salt Lake City,Utah"}]},{"given":"Arvin B.","family":"Cunningham","sequence":"additional","affiliation":[{"name":"Characterization System Services Idaho Natioanl Laboratory,Idaho Falls,USA"}]}],"member":"263","reference":[{"journal-title":"Keyence","article-title":"Automated Measurement and Inspection Examples [Power Semiconductors\/Inverters]","year":"2022","key":"ref8"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ICEEE.2011.6106661"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.2172\/1492033"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.jnucmat.2020.152703"},{"key":"ref6","first-page":"36","article-title":"Noncontact measurement: Can laser triangulation help you?","volume":"37","author":"kennedy","year":"1998","journal-title":"Quality Troy"},{"key":"ref5","first-page":"14","article-title":"Channel Gap Measurements In Nuclear Plate Fuel","author":"smith","year":"0","journal-title":"proc 46th Annual Review of Progress in Quantitative Nondestructive Evaluation QNDE2019"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/s11837-017-2552-y"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.jnucmat.2016.04.048"}],"event":{"name":"2023 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2023,5,22]]},"location":"Kuala Lumpur, Malaysia","end":{"date-parts":[[2023,5,25]]}},"container-title":["2023 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10175865\/10175876\/10175997.pdf?arnumber=10175997","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,8,1]],"date-time":"2023-08-01T18:01:40Z","timestamp":1690912900000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10175997\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,5,22]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/i2mtc53148.2023.10175997","relation":{},"subject":[],"published":{"date-parts":[[2023,5,22]]}}}