{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,27]],"date-time":"2026-01-27T17:37:10Z","timestamp":1769535430285,"version":"3.49.0"},"reference-count":21,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,5,22]],"date-time":"2023-05-22T00:00:00Z","timestamp":1684713600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,5,22]],"date-time":"2023-05-22T00:00:00Z","timestamp":1684713600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,5,22]]},"DOI":"10.1109\/i2mtc53148.2023.10176051","type":"proceedings-article","created":{"date-parts":[[2023,7,13]],"date-time":"2023-07-13T13:19:10Z","timestamp":1689254350000},"page":"01-06","source":"Crossref","is-referenced-by-count":1,"title":["An enhanced Smart Sampling algorithm based on Deep Learning"],"prefix":"10.1109","author":[{"given":"Marco","family":"Carrat\u00f9","sequence":"first","affiliation":[{"name":"University of Salerno,Department of Industrial Engineering,Fisciano,(SA),Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Salvatore Dello","family":"Iacono","sequence":"additional","affiliation":[{"name":"University of Salerno,Department of Industrial Engineering,Fisciano,(SA),Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Vincenzo","family":"Gallo","sequence":"additional","affiliation":[{"name":"University of Salerno,Department of Industrial Engineering,Fisciano,(SA),Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Vincenzo","family":"Paciello","sequence":"additional","affiliation":[{"name":"University of Salerno,Department of Industrial Engineering,Fisciano,(SA),Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Gustavo","family":"Monte","sequence":"additional","affiliation":[{"name":"Universidad Tecnologica Nacional,Facultad Regional del Neuquen Electronics Engineering Dep.,Plaza Huincul,Argentina"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Antonio","family":"Esp\u00edrito-Santo","sequence":"additional","affiliation":[{"name":"University of Beira Interior,Dep. Of Electromechanical Engineering IT - Institute of Telecommunications,Covilhã,Portugal"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/mn55117.2022.9887708"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2014.2347134"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.3390\/s21217375"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/i2mtc.2014.6860817"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/dcc.2010.66"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2014.2370456"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2014.2363945"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2014.2360987"},{"key":"ref9","first-page":"1","article-title":"IEEE Recommended Practice for Signal Treatment Applied to Smart Transducers","volume-title":"IEEE Std 21451\u2013001-2017","year":"2017"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/i2mtc48687.2022.9806625"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/3439950"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/eesms.2014.6923289"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/wowmom.2016.7523585"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/iwmn.2015.7322972"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/i2mtc48687.2022.9806627"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.procir.2021.03.088"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1155\/2021\/6647534"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.apacoust.2022.108849"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/access.2020.3027977"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.15388\/namc.2021.26.23056"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1049\/tje2.12132"}],"event":{"name":"2023 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","location":"Kuala Lumpur, Malaysia","start":{"date-parts":[[2023,5,22]]},"end":{"date-parts":[[2023,5,25]]}},"container-title":["2023 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10175865\/10175876\/10176051.pdf?arnumber=10176051","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,1,27]],"date-time":"2026-01-27T04:27:42Z","timestamp":1769488062000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10176051\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,5,22]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/i2mtc53148.2023.10176051","relation":{},"subject":[],"published":{"date-parts":[[2023,5,22]]}}}