{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T18:17:10Z","timestamp":1730225830964,"version":"3.28.0"},"reference-count":17,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,5,22]],"date-time":"2023-05-22T00:00:00Z","timestamp":1684713600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,5,22]],"date-time":"2023-05-22T00:00:00Z","timestamp":1684713600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,5,22]]},"DOI":"10.1109\/i2mtc53148.2023.10176073","type":"proceedings-article","created":{"date-parts":[[2023,7,13]],"date-time":"2023-07-13T13:19:10Z","timestamp":1689254350000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["Assessment of Sparse Fourier Transform for Spectral Measurements"],"prefix":"10.1109","author":[{"given":"Pasquale","family":"Daponte","sequence":"first","affiliation":[{"name":"University of Sannio,Department of Engineering,Benevento,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Luca","family":"De Vito","sequence":"additional","affiliation":[{"name":"University of Sannio,Department of Engineering,Benevento,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Francesco","family":"Picariello","sequence":"additional","affiliation":[{"name":"University of Sannio,Department of Engineering,Benevento,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sergio","family":"Rapuano","sequence":"additional","affiliation":[{"name":"University of Sannio,Department of Engineering,Benevento,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ioan","family":"Tudosa","sequence":"additional","affiliation":[{"name":"University of Sannio,Department of Engineering,Benevento,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC50364.2021.9460097"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2018.08.073"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/ab53a3"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/MSP.2014.2329131"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/3166186"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-05057-3_24"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.2989327"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.3390\/electronics10091117"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3095071"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.dsp.2022.103403"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/s00041-018-9616-4"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/s10208-009-9057-1"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.acha.2012.03.007"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/MIM.2007.4428580"},{"volume":"200","volume-title":"International vocabulary of metrology \u2013 basic and general concepts and associated terms (VIM)","year":"2012","key":"ref15"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/MIM.2021.9345597"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/S0263-2241(96)00058-9"}],"event":{"name":"2023 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2023,5,22]]},"location":"Kuala Lumpur, Malaysia","end":{"date-parts":[[2023,5,25]]}},"container-title":["2023 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10175865\/10175876\/10176073.pdf?arnumber=10176073","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,3,13]],"date-time":"2024-03-13T23:55:29Z","timestamp":1710374129000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10176073\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,5,22]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/i2mtc53148.2023.10176073","relation":{},"subject":[],"published":{"date-parts":[[2023,5,22]]}}}