{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,18]],"date-time":"2026-03-18T14:18:37Z","timestamp":1773843517831,"version":"3.50.1"},"reference-count":16,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,5,22]],"date-time":"2023-05-22T00:00:00Z","timestamp":1684713600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,5,22]],"date-time":"2023-05-22T00:00:00Z","timestamp":1684713600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,5,22]]},"DOI":"10.1109\/i2mtc53148.2023.10176110","type":"proceedings-article","created":{"date-parts":[[2023,7,13]],"date-time":"2023-07-13T17:19:10Z","timestamp":1689268750000},"page":"1-5","source":"Crossref","is-referenced-by-count":7,"title":["Uncertainty and Lack of Information Affecting the Training of Machine Learning Algorithms for Fault Prediction of Cable-Joints"],"prefix":"10.1109","author":[{"given":"Virginia","family":"Negri","sequence":"first","affiliation":[{"name":"Alma Mater Studiorum - University of Bologna,Department of Electrical, Electronic, and Information Engineering,Bologna,Italy,40136"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Alessandro","family":"Mingotti","sequence":"additional","affiliation":[{"name":"Alma Mater Studiorum - University of Bologna,Department of Electrical, Electronic, and Information Engineering,Bologna,Italy,40136"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Roberto","family":"Tinarelli","sequence":"additional","affiliation":[{"name":"Alma Mater Studiorum - University of Bologna,Department of Electrical, Electronic, and Information Engineering,Bologna,Italy,40136"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lorenzo","family":"Peretto","sequence":"additional","affiliation":[{"name":"Alma Mater Studiorum - University of Bologna,Department of Electrical, Electronic, and Information Engineering,Bologna,Italy,40136"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/CEIDP.2018.8544904"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/AMPS.2018.8494860"},{"key":"ref15","first-page":"1310","article-title":"A review of supervised machine learning algorithms","author":"singh","year":"0","journal-title":"2016 3rd International Conference on Computing for Sustainable Global Development (INDIACom)"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.21275\/ART20203995"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/CSITSS54238.2021.9683524"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/AMPS55790.2022.9978846"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1049\/iet-rpg.2019.0123"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.rser.2019.109499"},{"key":"ref16","article-title":"Metrics for Multi-Class Classification: an Overview","author":"grandini","year":"2020","journal-title":"ArXiv"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1609\/aimag.v40i4.4812"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.21014\/acta_imeko.v10i4.1181"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/aaf466"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1088\/1742-6596\/1684\/1\/012003"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1541\/ieejpes.127.1219"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.compag.2020.105653"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2014.2347218"}],"event":{"name":"2023 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","location":"Kuala Lumpur, Malaysia","start":{"date-parts":[[2023,5,22]]},"end":{"date-parts":[[2023,5,25]]}},"container-title":["2023 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10175865\/10175876\/10176110.pdf?arnumber=10176110","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,8,1]],"date-time":"2023-08-01T18:01:17Z","timestamp":1690912877000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10176110\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,5,22]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/i2mtc53148.2023.10176110","relation":{},"subject":[],"published":{"date-parts":[[2023,5,22]]}}}