{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,1]],"date-time":"2026-02-01T05:46:58Z","timestamp":1769924818680,"version":"3.49.0"},"reference-count":21,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,5,20]],"date-time":"2024-05-20T00:00:00Z","timestamp":1716163200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,5,20]],"date-time":"2024-05-20T00:00:00Z","timestamp":1716163200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["U2241259,62031002,61827802"],"award-info":[{"award-number":["U2241259,62031002,61827802"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,5,20]]},"DOI":"10.1109\/i2mtc60896.2024.10560520","type":"proceedings-article","created":{"date-parts":[[2024,6,28]],"date-time":"2024-06-28T17:53:14Z","timestamp":1719597194000},"page":"1-5","source":"Crossref","is-referenced-by-count":1,"title":["A Phase Noise Immune TDLAS Flow Velocimetry via Using Modulated Waveform Synchronizing"],"prefix":"10.1109","author":[{"given":"Guangyu","family":"Hou","sequence":"first","affiliation":[{"name":"School of Instrumentation and Optoelectronic Engineering, Beihang University,Beijing,China"}]},{"given":"Lijun","family":"Xu","sequence":"additional","affiliation":[{"name":"School of Instrumentation and Optoelectronic Engineering, Beihang University,Beijing,China"}]},{"given":"Yiding","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Instrumentation and Optoelectronic Engineering, Beihang University,Beijing,China"}]},{"given":"Zhang","family":"Cao","sequence":"additional","affiliation":[{"name":"School of Instrumentation and Optoelectronic Engineering, Beihang University,Beijing,China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1080\/00102202.2017.1392515"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1080\/05704928.2018.1448854"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.pecs.2016.12.002"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/s00340-014-5884-0"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2018.2799098"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2020.2990519"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2019.2962736"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.2998935"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3076852"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3243672"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1364\/OE.25.00A762"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/s00340-019-7239-3"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2019.8827049"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1364\/AO.58.000205"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.2514\/1.J062620"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1088\/1674-1056\/ac339b"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1117\/1.OE.58.11.114101"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1007\/s12206-023-0726-9"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.2514\/1.J053842"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1364\/AO.51.004788"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.7498\/aps.61.034214"}],"event":{"name":"2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","location":"Glasgow, United Kingdom","start":{"date-parts":[[2024,5,20]]},"end":{"date-parts":[[2024,5,23]]}},"container-title":["2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10560479\/10560519\/10560520.pdf?arnumber=10560520","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,6,30]],"date-time":"2024-06-30T04:03:00Z","timestamp":1719720180000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10560520\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,5,20]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/i2mtc60896.2024.10560520","relation":{},"subject":[],"published":{"date-parts":[[2024,5,20]]}}}