{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T07:44:55Z","timestamp":1725781495020},"reference-count":13,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,5,20]],"date-time":"2024-05-20T00:00:00Z","timestamp":1716163200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,5,20]],"date-time":"2024-05-20T00:00:00Z","timestamp":1716163200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100012166","name":"National Key R&D Program of China","doi-asserted-by":"publisher","award":["2021YFC3002200"],"award-info":[{"award-number":["2021YFC3002200"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,5,20]]},"DOI":"10.1109\/i2mtc60896.2024.10560541","type":"proceedings-article","created":{"date-parts":[[2024,6,28]],"date-time":"2024-06-28T17:53:14Z","timestamp":1719597194000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["An Improved Measurement System for Electrical Bioimpedance Spectroscopy"],"prefix":"10.1109","author":[{"given":"Shuaifu","family":"Zhang","sequence":"first","affiliation":[{"name":"School of Electrical and Information Engineering, Tianjin University,Tianjin Key Laboratory of Process Measurement and Control,Tianjin,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yanbin","family":"Xu","sequence":"additional","affiliation":[{"name":"School of Electrical and Information Engineering, Tianjin University,Tianjin Key Laboratory of Process Measurement and Control,Tianjin,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Qingwei","family":"Hu","sequence":"additional","affiliation":[{"name":"School of Electrical and Information Engineering, Tianjin University,Tianjin Key Laboratory of Process Measurement and Control,Tianjin,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Fan","family":"Chen","sequence":"additional","affiliation":[{"name":"School of Electrical and Information Engineering, Tianjin University,Tianjin Key Laboratory of Process Measurement and Control,Tianjin,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ziqiang","family":"Cui","sequence":"additional","affiliation":[{"name":"School of Electrical and Information Engineering, Tianjin University,Tianjin Key Laboratory of Process Measurement and Control,Tianjin,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Qi","family":"Lv","sequence":"additional","affiliation":[{"name":"Institute of Disaster and Emergency Medicine, Tianjin University,Tianjin,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Haojun","family":"Fan","sequence":"additional","affiliation":[{"name":"Institute of Disaster and Emergency Medicine, Tianjin University,Tianjin,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Feng","family":"Dong","sequence":"additional","affiliation":[{"name":"School of Electrical and Information Engineering, Tianjin University,Tianjin Key Laboratory of Process Measurement and Control,Tianjin,China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TBME.2010.2054090"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TBME.2016.2641958"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2022.3228479"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/s13311-016-0491-x"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2021.3065846"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1038\/s41598-023-45154-8"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ISICIR.2016.7829682"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1088\/0967-3334\/29\/6\/S23"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1515\/mms-2015-0006"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/MeMeA.2016.7533803"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/BIOCAS.2017.8325138"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.3390\/app10030878"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.enzmictec.2008.09.005"}],"event":{"name":"2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2024,5,20]]},"location":"Glasgow, United Kingdom","end":{"date-parts":[[2024,5,23]]}},"container-title":["2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10560479\/10560519\/10560541.pdf?arnumber=10560541","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,6,30]],"date-time":"2024-06-30T04:17:48Z","timestamp":1719721068000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10560541\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,5,20]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/i2mtc60896.2024.10560541","relation":{},"subject":[],"published":{"date-parts":[[2024,5,20]]}}}