{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,7,31]],"date-time":"2025-07-31T00:49:43Z","timestamp":1753922983263},"reference-count":18,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,5,20]],"date-time":"2024-05-20T00:00:00Z","timestamp":1716163200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,5,20]],"date-time":"2024-05-20T00:00:00Z","timestamp":1716163200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,5,20]]},"DOI":"10.1109\/i2mtc60896.2024.10560632","type":"proceedings-article","created":{"date-parts":[[2024,6,28]],"date-time":"2024-06-28T17:53:14Z","timestamp":1719597194000},"page":"1-5","source":"Crossref","is-referenced-by-count":1,"title":["A Simple Classification Method for Evaluating Influence Factors Affecting Instrument Transformer Accuracy"],"prefix":"10.1109","author":[{"given":"Alessandro","family":"Mingotti","sequence":"first","affiliation":[{"name":"Electronic and Information Engineering “Gugliemo Marconi” Alma Mater Studiorum - University of Bologna,Department of Electrical,Bologna,Italy,40136"}]},{"given":"Roberto","family":"Tinarelli","sequence":"additional","affiliation":[{"name":"Electronic and Information Engineering “Gugliemo Marconi” Alma Mater Studiorum - University of Bologna,Department of Electrical,Bologna,Italy,40136"}]},{"given":"Lorenzo","family":"Peretto","sequence":"additional","affiliation":[{"name":"Electronic and Information Engineering “Gugliemo Marconi” Alma Mater Studiorum - University of Bologna,Department of Electrical,Bologna,Italy,40136"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/isgt-la.2015.7381273"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ieps.2014.6874202"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ichqp.2016.7783305"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/amps50177.2021.9586040"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/amps.2014.6947701"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/amps.2019.8897770"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ciced.2014.6991884"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/gtdasia.2019.8716029"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/amps.2019.8897786"},{"journal-title":"International Standardization Organization, Geneva, Switzerland","article-title":"Instrument transformers - Part 1: General requirements","year":"2010","key":"ref10"},{"journal-title":"Instrument Transformers; International Standardization Organization: Geneva, Switzerland","article-title":"Part 6: Additional general requirements for low-power instrument transformers","year":"2016","key":"ref11"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.3390\/s22010397"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.3390\/en16135012"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/isgt-asia.2015.7387059"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/amps50177.2021.9586003"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC43012.2020.9128777"},{"journal-title":"Instrument Transformers; International Standardization Organization: Geneva, Switzerland","article-title":"Part 10: Additional requirements for low-power passive current transformers","year":"2018","key":"ref18"},{"journal-title":"International Standardization Organization, Geneva, Switzerland","article-title":"Instrument transformers - Part 11: Additional requirements for low-power passive voltage transformers","year":"2018","key":"ref19"}],"event":{"name":"2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2024,5,20]]},"location":"Glasgow, United Kingdom","end":{"date-parts":[[2024,5,23]]}},"container-title":["2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10560479\/10560519\/10560632.pdf?arnumber=10560632","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,6,30]],"date-time":"2024-06-30T04:07:04Z","timestamp":1719720424000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10560632\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,5,20]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/i2mtc60896.2024.10560632","relation":{},"subject":[],"published":{"date-parts":[[2024,5,20]]}}}