{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T07:45:30Z","timestamp":1725781530454},"reference-count":5,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,5,20]],"date-time":"2024-05-20T00:00:00Z","timestamp":1716163200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,5,20]],"date-time":"2024-05-20T00:00:00Z","timestamp":1716163200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100014013","name":"UKRI","doi-asserted-by":"publisher","award":["10,084,012"],"award-info":[{"award-number":["10,084,012"]}],"id":[{"id":"10.13039\/100014013","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,5,20]]},"DOI":"10.1109\/i2mtc60896.2024.10560654","type":"proceedings-article","created":{"date-parts":[[2024,6,28]],"date-time":"2024-06-28T17:53:14Z","timestamp":1719597194000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["Measuring Wideband Nonlinearity of Analog to Digital Converters"],"prefix":"10.1109","author":[{"given":"R. Allan","family":"Belcher","sequence":"first","affiliation":[{"name":"Signal Conversion Ltd,Swansea,Wales"}]},{"given":"Luis","family":"Palafox","sequence":"additional","affiliation":[{"name":"Physikalisch-Technische Bundesanstalt,Braunschweig,Germany"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1088\/0026-1394\/52\/4\/528"},{"key":"ref2","first-page":"1","article-title":"IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters","volume-title":"IEEE Std 1241-2010 (Revision of IEEE Std 1241-2000)","year":"2011"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2015.2450296"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9780511546907"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1049\/ji-3-2.1945.0011"}],"event":{"name":"2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2024,5,20]]},"location":"Glasgow, United Kingdom","end":{"date-parts":[[2024,5,23]]}},"container-title":["2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10560479\/10560519\/10560654.pdf?arnumber=10560654","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,6,30]],"date-time":"2024-06-30T04:24:07Z","timestamp":1719721447000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10560654\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,5,20]]},"references-count":5,"URL":"https:\/\/doi.org\/10.1109\/i2mtc60896.2024.10560654","relation":{},"subject":[],"published":{"date-parts":[[2024,5,20]]}}}