{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T18:18:13Z","timestamp":1730225893422,"version":"3.28.0"},"reference-count":26,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,5,20]],"date-time":"2024-05-20T00:00:00Z","timestamp":1716163200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,5,20]],"date-time":"2024-05-20T00:00:00Z","timestamp":1716163200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,5,20]]},"DOI":"10.1109\/i2mtc60896.2024.10560695","type":"proceedings-article","created":{"date-parts":[[2024,6,28]],"date-time":"2024-06-28T17:53:14Z","timestamp":1719597194000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["Signal Quality Assessment in Low-Density and Single Channel Surface Electromyography"],"prefix":"10.1109","author":[{"given":"Emma","family":"Farago","sequence":"first","affiliation":[{"name":"Carleton University,Systems and Computer Engineering,Ottawa,Canada"}]},{"given":"Adrian D. C.","family":"Chan","sequence":"additional","affiliation":[{"name":"Carleton University,Systems and Computer Engineering,Ottawa,Canada"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.apmr.2018.09.120"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1080\/03091902.2019.1609610"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.3389\/fneur.2020.578559"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1080\/001401300750004159"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1002\/9781119082934.ch13"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.3389\/fneur.2020.588451"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.jbiomech.2004.02.047"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2014.2317296"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/IEMBS.2010.5627280"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/s11517-011-0790-7"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/MeMeA.2012.6226629"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/IEMBS.2011.6091958"},{"issue":"1","key":"ref13","article-title":"CleanEMG: Quantifying power line interference in surface EMG signals","volume-title":"Canadian Medical and Biological Engineering Society Proceedings","volume":"34","author":"Abser"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/MeMeA.2011.5966728"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1186\/1743-0003-9-24"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3320737"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/S1050-6411(00)00027-4"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.jneumeth.2003.10.014"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TBME.1985.325614"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.3390\/s23104759"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1038\/s41597-020-00717-6"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2012.01.102"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1152\/jappl.1995.79.5.1803"},{"key":"ref24","first-page":"1157","article-title":"An introduction to variable and feature selection","volume":"3","author":"Guyon","year":"2003","journal-title":"J. Mach. Learn. Res."},{"key":"ref25","first-page":"129","article-title":"The feature selection problem: Traditional methods and a new algorithm","volume-title":"Proceedings of the Tenth National Conference on Artificial Intelligence, ser","author":"Kira"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/JAS.2021.1003865"}],"event":{"name":"2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2024,5,20]]},"location":"Glasgow, United Kingdom","end":{"date-parts":[[2024,5,23]]}},"container-title":["2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10560479\/10560519\/10560695.pdf?arnumber=10560695","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,6,29]],"date-time":"2024-06-29T05:26:43Z","timestamp":1719638803000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10560695\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,5,20]]},"references-count":26,"URL":"https:\/\/doi.org\/10.1109\/i2mtc60896.2024.10560695","relation":{},"subject":[],"published":{"date-parts":[[2024,5,20]]}}}