{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,3,22]],"date-time":"2025-03-22T12:32:35Z","timestamp":1742646755025,"version":"3.28.0"},"reference-count":25,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,5,20]],"date-time":"2024-05-20T00:00:00Z","timestamp":1716163200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,5,20]],"date-time":"2024-05-20T00:00:00Z","timestamp":1716163200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100013168","name":"Istituto Nazionale di Fisica Nucleare (INFN)","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100013168","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,5,20]]},"DOI":"10.1109\/i2mtc60896.2024.10560704","type":"proceedings-article","created":{"date-parts":[[2024,6,28]],"date-time":"2024-06-28T17:53:14Z","timestamp":1719597194000},"page":"1-6","source":"Crossref","is-referenced-by-count":2,"title":["Operational Amplifier Characterization at Cryogenic Temperatures"],"prefix":"10.1109","author":[{"given":"Danilo","family":"Santoro","sequence":"first","affiliation":[{"name":"Università degli Studi di Parma,Dept. of Engineering and Architecture,Parma,Italy"}]},{"given":"Giovanni","family":"Chiorboli","sequence":"additional","affiliation":[{"name":"Università degli Studi di Parma,Dept. of Engineering and Architecture,Parma,Italy"}]},{"given":"Marco","family":"Bassani","sequence":"additional","affiliation":[{"name":"Università degli Studi di Parma,Dept. of Engineering and Architecture,Parma,Italy"}]},{"given":"Alessandro","family":"Andreani","sequence":"additional","affiliation":[{"name":"Università degli Studi di Milano,Dept. of Physics,Milano,Italy"}]},{"given":"Paolo","family":"Cova","sequence":"additional","affiliation":[{"name":"Università degli Studi di Parma,Dept. of Engineering and Architecture,Parma,Italy"}]},{"given":"Nicola","family":"Delmonte","sequence":"additional","affiliation":[{"name":"Università degli Studi di Parma,Dept. of Engineering and Architecture,Parma,Italy"}]},{"given":"Massimo","family":"Lazzaroni","sequence":"additional","affiliation":[{"name":"Università degli Studi di Milano,Dept. of Physics,Milano,Italy"}]},{"given":"Andrea","family":"Riminucci","sequence":"additional","affiliation":[{"name":"Università degli Studi di Milano,Dept. of Physics,Milano,Italy"}]},{"given":"Valeria","family":"Trabattoni","sequence":"additional","affiliation":[{"name":"Università degli Studi di Milano,Dept. of Physics,Milano,Italy"}]},{"given":"Andrea","family":"Zani","sequence":"additional","affiliation":[{"name":"INFN,Sezione di Milano,Milano,Italy"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.nima.2004.02.044"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1140\/epjc\/s10052-017-5326-3"},{"volume-title":"Dune","key":"ref3"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.2172\/1873688"},{"key":"ref5","article-title":"The Long-Baseline Neutrino Experiment: Exploring Fundamental Symmetries of the Universe","volume-title":"Snowmass 2013: Workshop on Energy Frontier","volume":"7","author":"Adams"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1088\/1748-0221\/15\/08\/T08008"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1088\/1748-0221\/17\/01\/P01005"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC50364.2021.9459995"},{"issue":"04","key":"ref9","first-page":"C04026","article-title":"The x-arapuca: an improvement of the arapuca device","volume-title":"Journal of Instrumentation","volume":"13","author":"Machado","year":"2018"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1088\/1748-0221\/19\/01\/t01007"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.2172\/2246755"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1002\/j.1538-7305.1978.tb02205.x"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.3390\/photonics8080335"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/AERO.2018.8396695"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/1-4020-4330-9_77"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ICIEA.2018.8397935"},{"key":"ref17","article-title":"Designing Ultrafast Loop Response With Type III Compensation for Current Mode Step-Down Converters","author":"Ning","year":"2009","journal-title":"Texas Instruments, Tech. Rep."},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/CCECE.2003.1226385"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/AERO47225.2020.9172517"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1504\/IJSPACESE.2013.058857"},{"journal-title":"Texas Instruments, Tech. Rep.","article-title":"LMV3xxA Low-Voltage Rail-to-Rail Output Operational Amplifiers","year":"2017","key":"ref21"},{"key":"ref22","article-title":"Simple Op Amp Measurements","author":"Bryant","year":"2011","journal-title":"Analog Devices, Tech. Rep."},{"journal-title":"34970A Data Acquisition\/ Switch Unit Family, Keysight Technology","first-page":"5965","year":"2020","key":"ref23"},{"journal-title":"HP 4145B Semiconductor Parameter Analyzer, Hewlett Packard","first-page":"04145","year":"1989","key":"ref24"},{"volume-title":"Guide to the Expression of Uncertainty in Measurement (GUM) JCGM 100:2008 and Its Supplements JCGM 101:2008 JCGM 102:2011 JCGM 104:2009","year":"2008","key":"ref25"}],"event":{"name":"2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2024,5,20]]},"location":"Glasgow, United Kingdom","end":{"date-parts":[[2024,5,23]]}},"container-title":["2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10560479\/10560519\/10560704.pdf?arnumber=10560704","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,6,30]],"date-time":"2024-06-30T04:07:09Z","timestamp":1719720429000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10560704\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,5,20]]},"references-count":25,"URL":"https:\/\/doi.org\/10.1109\/i2mtc60896.2024.10560704","relation":{},"subject":[],"published":{"date-parts":[[2024,5,20]]}}}