{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T07:45:23Z","timestamp":1725781523688},"reference-count":16,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,5,20]],"date-time":"2024-05-20T00:00:00Z","timestamp":1716163200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,5,20]],"date-time":"2024-05-20T00:00:00Z","timestamp":1716163200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,5,20]]},"DOI":"10.1109\/i2mtc60896.2024.10560890","type":"proceedings-article","created":{"date-parts":[[2024,6,28]],"date-time":"2024-06-28T17:53:14Z","timestamp":1719597194000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["Bearing Fault Monitoring Based on Flexible Piezoelectric Accelerometer"],"prefix":"10.1109","author":[{"given":"Wenkang","family":"Li","sequence":"first","affiliation":[{"name":"Xi'an Jiaotong University,State Key Laboratory for Manufacturing Systems Engineering,Xi'an,China"}]},{"given":"Hailin","family":"Cao","sequence":"additional","affiliation":[{"name":"Xi'an Jiaotong University,State Key Laboratory for Manufacturing Systems Engineering,Xi'an,China"}]},{"given":"Liuyang","family":"Zhang","sequence":"additional","affiliation":[{"name":"Xi'an Jiaotong University,State Key Laboratory for Manufacturing Systems Engineering,Xi'an,China"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1016\/j.ymssp.2022.109987"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1139\/tcsme-2022-0175"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1007\/s12206-017-1141-x"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1115\/1.4031333"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1016\/j.compstruct.2020.113528"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1016\/j.jsv.2015.03.016"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1177\/1045389x13491021"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1109\/tie.2021.3095785"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.3390\/polym15040826"},{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1109\/LSENS.2020.3030804"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1016\/j.ymssp.2022.109330"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1016\/j.matdes.2020.109415"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1177\/14759217221126812"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1088\/1361-665X\/ab2d08"},{"doi-asserted-by":"publisher","key":"ref15","DOI":"10.3390\/s18072084"},{"doi-asserted-by":"publisher","key":"ref16","DOI":"10.1016\/j.compstruct.2019.01.008"}],"event":{"name":"2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2024,5,20]]},"location":"Glasgow, United Kingdom","end":{"date-parts":[[2024,5,23]]}},"container-title":["2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10560479\/10560519\/10560890.pdf?arnumber=10560890","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,6,30]],"date-time":"2024-06-30T04:20:11Z","timestamp":1719721211000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10560890\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,5,20]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/i2mtc60896.2024.10560890","relation":{},"subject":[],"published":{"date-parts":[[2024,5,20]]}}}