{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,7,25]],"date-time":"2025-07-25T10:51:30Z","timestamp":1753440690039},"reference-count":14,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,5,20]],"date-time":"2024-05-20T00:00:00Z","timestamp":1716163200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,5,20]],"date-time":"2024-05-20T00:00:00Z","timestamp":1716163200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,5,20]]},"DOI":"10.1109\/i2mtc60896.2024.10560971","type":"proceedings-article","created":{"date-parts":[[2024,6,28]],"date-time":"2024-06-28T17:53:14Z","timestamp":1719597194000},"page":"1-6","source":"Crossref","is-referenced-by-count":4,"title":["Additively Manufactured Aperture-based FSS"],"prefix":"10.1109","author":[{"given":"Alexander","family":"Hook","sequence":"first","affiliation":[{"name":"Missouri University of Science and Technology,Microwave Sensing (µSense) Laboratory,Department of Electrical and Computer Engineering,Rolla,Missouri,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Doyle T.","family":"Motes","sequence":"additional","affiliation":[{"name":"Texas Research Institute (TRI) Austin Inc.,Nondestructive Evaluation Division,Austin,Texas,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Cody","family":"Morrow","sequence":"additional","affiliation":[{"name":"Texas Research Institute (TRI) Austin Inc.,Nondestructive Evaluation Division,Austin,Texas,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kristen M.","family":"Donnell","sequence":"additional","affiliation":[{"name":"Missouri University of Science and Technology,Microwave Sensing (µSense) Laboratory,Department of Electrical and Computer Engineering,Rolla,Missouri,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"crossref","DOI":"10.1002\/0471723770","volume-title":"Frequency Selective Surfaces Theory and Design","author":"Munk","year":"2000"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TAP.2012.2194640"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/LAWP.2009.2039110"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TAP.2012.2227444"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/APUSNCURSINRSM.2018.8608318"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1088\/0964-1726\/22\/2\/025002"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/APS.2014.6905364"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/APUSNCURSINRSM.2017.8072382"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/APUSNCURSINRSM.2018.8609215"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCPMT.2021.3123985"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.23919\/EuMC48046.2021.9338224"},{"journal-title":"Additive Manufacturing of Electrically Conductive Materials","author":"McEneny","key":"ref12"},{"volume-title":"Microwave Engineering","year":"2021","author":"Pozar","key":"ref14"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/AP-S\/USNC-URSI47032.2022.9886550"}],"event":{"name":"2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2024,5,20]]},"location":"Glasgow, United Kingdom","end":{"date-parts":[[2024,5,23]]}},"container-title":["2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10560479\/10560519\/10560971.pdf?arnumber=10560971","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,6,30]],"date-time":"2024-06-30T04:20:18Z","timestamp":1719721218000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10560971\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,5,20]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/i2mtc60896.2024.10560971","relation":{},"subject":[],"published":{"date-parts":[[2024,5,20]]}}}