{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,5]],"date-time":"2025-11-05T06:59:26Z","timestamp":1762325966089},"reference-count":20,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,5,20]],"date-time":"2024-05-20T00:00:00Z","timestamp":1716163200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,5,20]],"date-time":"2024-05-20T00:00:00Z","timestamp":1716163200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,5,20]]},"DOI":"10.1109\/i2mtc60896.2024.10561022","type":"proceedings-article","created":{"date-parts":[[2024,6,28]],"date-time":"2024-06-28T17:53:14Z","timestamp":1719597194000},"page":"1-6","source":"Crossref","is-referenced-by-count":1,"title":["Accelerated Aging Quantification of XL-ETFE Wires in Low Pressure Aircraft Environments"],"prefix":"10.1109","author":[{"given":"Pau","family":"Bas-Calopa","sequence":"first","affiliation":[{"name":"Universitat Polit&#x00E8;cnica de Catalunya,Electrical Engineering Department,Terrassa,Spain"}]},{"given":"Jordi-Roger","family":"Riba","sequence":"additional","affiliation":[{"name":"Universitat Polit&#x00E8;cnica de Catalunya,Electrical Engineering Department,Terrassa,Spain"}]},{"given":"Manuel","family":"Moreno-Eguilaz","sequence":"additional","affiliation":[{"name":"Universitat Polit&#x00E8;cnica de Catalunya,Electronics Engineering Department,Terrassa,Spain"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/elinsl.2010.5549718"},{"key":"ref2","article-title":"CO2 emissions from commercial aviation: 2013, 2018, and 2019 | International Council on Clean Transportation","volume-title":"International Council on Clean Transportation (ICCT)","author":"Graver","year":"2020"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-31676-1_30"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tepm.2003.820822"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/eic.2018.8481047"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/tpas.1972.293419"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2005.1522185"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/94.326657"},{"key":"ref9","first-page":"1","article-title":"Understanding Corona Discharges using Digital Imaging","volume-title":"ICHVE 2018 \u2013 2018 IEEE International Conference on High Voltage Engineering and Application","author":"Prasad"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.scitotenv.2019.135873"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.3390\/app12178595"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.3390\/en9050369"},{"key":"ref13","first-page":"1","article-title":"EN 3475\u2013603 - Aerospace series - Cables, electrical, aircraft use - Test methods - Part 603: Resistance to wet arc tracking","year":"2018","journal-title":"European Committee for Standardization, Brussels, Belgium"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.21926\/rpm.2101005"},{"volume-title":"IEEE Std 100\u20132000 The Authoritative Dictionary of IEEE Standards Terms, Seventh Edition","year":"2000","key":"ref15"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.3390\/s22051856"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2008.4656247"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.3390\/s22020492"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.3390\/ma15051677"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.3390\/s20247219"}],"event":{"name":"2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2024,5,20]]},"location":"Glasgow, United Kingdom","end":{"date-parts":[[2024,5,23]]}},"container-title":["2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10560479\/10560519\/10561022.pdf?arnumber=10561022","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,6,30]],"date-time":"2024-06-30T04:20:22Z","timestamp":1719721222000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10561022\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,5,20]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/i2mtc60896.2024.10561022","relation":{},"subject":[],"published":{"date-parts":[[2024,5,20]]}}}