{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T01:56:47Z","timestamp":1740103007552,"version":"3.37.3"},"reference-count":17,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,5,20]],"date-time":"2024-05-20T00:00:00Z","timestamp":1716163200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,5,20]],"date-time":"2024-05-20T00:00:00Z","timestamp":1716163200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,5,20]]},"DOI":"10.1109\/i2mtc60896.2024.10561025","type":"proceedings-article","created":{"date-parts":[[2024,6,28]],"date-time":"2024-06-28T17:53:14Z","timestamp":1719597194000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["A Simplified Topology for the Design of Low Noise Voltage Amplifiers for Low Frequency Noise Measurements"],"prefix":"10.1109","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-3295-0206","authenticated-orcid":false,"given":"Graziella","family":"Scandurra","sequence":"first","affiliation":[{"name":"University of Messina,Department of Engineering,Messina,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3806-9276","authenticated-orcid":false,"given":"Krzysztof","family":"Achtenberg","sequence":"additional","affiliation":[{"name":"Institute of Optoelectronics, Military University of Technology,Warsaw,Poland"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2555-833X","authenticated-orcid":false,"given":"Carmine","family":"Ciofi","sequence":"additional","affiliation":[{"name":"University of Messina,Department of Engineering,Messina,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/s1359-0286(02)00025-6"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/16.333839"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/s0026-2714(02)00347-5"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/s0065-2539(08)60768-4"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/S0065-2539(08)60017-7"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1088\/0022-3727\/33\/21\/201"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.physrep.2022.06.005"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.3390\/app10175818"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2008.923175"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1063\/5.0116589"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/icnf.2017.7985946"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1063\/1.3258197"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/19.69939"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2015.2389336"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2008.918213"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.3390\/electronics8101197"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.3390\/electronics11132011"}],"event":{"name":"2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2024,5,20]]},"location":"Glasgow, United Kingdom","end":{"date-parts":[[2024,5,23]]}},"container-title":["2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10560479\/10560519\/10561025.pdf?arnumber=10561025","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,6,29]],"date-time":"2024-06-29T05:28:50Z","timestamp":1719638930000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10561025\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,5,20]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/i2mtc60896.2024.10561025","relation":{},"subject":[],"published":{"date-parts":[[2024,5,20]]}}}