{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,6,6]],"date-time":"2025-06-06T04:51:31Z","timestamp":1749185491454,"version":"3.37.3"},"reference-count":19,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,5,20]],"date-time":"2024-05-20T00:00:00Z","timestamp":1716163200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,5,20]],"date-time":"2024-05-20T00:00:00Z","timestamp":1716163200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100014438","name":"Business Finland","doi-asserted-by":"publisher","award":["3014\/31\/2021"],"award-info":[{"award-number":["3014\/31\/2021"]}],"id":[{"id":"10.13039\/501100014438","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,5,20]]},"DOI":"10.1109\/i2mtc60896.2024.10561069","type":"proceedings-article","created":{"date-parts":[[2024,6,28]],"date-time":"2024-06-28T17:53:14Z","timestamp":1719597194000},"page":"1-6","source":"Crossref","is-referenced-by-count":1,"title":["Using a Mobile Phone to Measure an Overhead Crane Hook Condition"],"prefix":"10.1109","author":[{"ORCID":"https:\/\/orcid.org\/0009-0002-5089-8237","authenticated-orcid":false,"given":"Joose","family":"Lankia","sequence":"first","affiliation":[{"name":"Aalto University,Department of Mechanical Engineering,Espoo,Finland"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3246-8199","authenticated-orcid":false,"given":"Riku","family":"Ala-Laurinaho","sequence":"additional","affiliation":[{"name":"Aalto University,Department of Mechanical Engineering,Espoo,Finland"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijcce.2022.08.003"},{"key":"ref2","doi-asserted-by":"crossref","first-page":"100114","DOI":"10.1016\/j.sintl.2021.100114","article-title":"Industrial perspectives of 3D scanning: Features, roles and its analytical applications","volume":"2","author":"Javaid","year":"2021","journal-title":"Sensors International"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1515\/aot-2021-0023"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1061\/(ASCE)CO.1943-7862.0000114"},{"key":"ref5","first-page":"36","author":"Lankia","year":"2023","journal-title":"Alypuhelimella tuotettujen 3D-mallien soveltuvuus koneenosien huoltotarpeiden arviointiin"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1002\/esp.3648"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1515\/geo-2017-0023"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.3390\/rs15153824"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.2166\/nh.2017.075"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.3390\/s21030922"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.3390\/electronics8121441"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1111\/phor.12243"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.9733\/JGG.2023R0008.E"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2018.06.037"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.3390\/ma10050548"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.geomorph.2012.08.021"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.445"},{"journal-title":"The European Committee for Standardization (CEN)","article-title":"Cranes - General design - Part 3-5: Limit states and proof of competence of forged and cast hooks","year":"2021","key":"ref18"},{"volume-title":"Distance calculator","year":"2023","author":"Lankia","key":"ref19"}],"event":{"name":"2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2024,5,20]]},"location":"Glasgow, United Kingdom","end":{"date-parts":[[2024,5,23]]}},"container-title":["2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10560479\/10560519\/10561069.pdf?arnumber=10561069","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,6,29]],"date-time":"2024-06-29T05:27:49Z","timestamp":1719638869000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10561069\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,5,20]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/i2mtc60896.2024.10561069","relation":{},"subject":[],"published":{"date-parts":[[2024,5,20]]}}}