{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,8]],"date-time":"2024-09-08T07:45:25Z","timestamp":1725781525398},"reference-count":22,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,5,20]],"date-time":"2024-05-20T00:00:00Z","timestamp":1716163200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,5,20]],"date-time":"2024-05-20T00:00:00Z","timestamp":1716163200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["81827806"],"award-info":[{"award-number":["81827806"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,5,20]]},"DOI":"10.1109\/i2mtc60896.2024.10561103","type":"proceedings-article","created":{"date-parts":[[2024,6,28]],"date-time":"2024-06-28T17:53:14Z","timestamp":1719597194000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["Optical Coherent Tomography Driven Wall Shear Stress Prediction with Deep Neural Network in Projection Domain"],"prefix":"10.1109","author":[{"given":"Yan","family":"Li","sequence":"first","affiliation":[{"name":"School of Electrical and Information Engineering Tianjin University,Tianjin Key Laboratory of Process Measurement and Control,Tianjin,China,300072"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shangjie","family":"Ren","sequence":"additional","affiliation":[{"name":"School of Electrical and Information Engineering Tianjin University,Tianjin Key Laboratory of Process Measurement and Control,Tianjin,China,300072"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Feng","family":"Dong","sequence":"additional","affiliation":[{"name":"School of Information and Intelligent Engineering Tianjin Renai College,Tianjin,China,300072"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"ref1","DOI":"10.1161\/CIR.0b013e31820a55f5"},{"doi-asserted-by":"publisher","key":"ref2","DOI":"10.1161\/jaha.116.004186"},{"doi-asserted-by":"publisher","key":"ref3","DOI":"10.1016\/j.jbiomech.2014.07.030"},{"doi-asserted-by":"publisher","key":"ref4","DOI":"10.1002\/cnm.2625"},{"doi-asserted-by":"publisher","key":"ref5","DOI":"10.1007\/s10439-012-0681-6"},{"doi-asserted-by":"publisher","key":"ref6","DOI":"10.1017\/jfm.2019.238"},{"doi-asserted-by":"publisher","key":"ref7","DOI":"10.1098\/rsif.2017.0844"},{"doi-asserted-by":"publisher","key":"ref8","DOI":"10.1115\/1.4043290"},{"doi-asserted-by":"publisher","key":"ref9","DOI":"10.1016\/j.compbiomed.2020.104038"},{"doi-asserted-by":"publisher","key":"ref10","DOI":"10.1126\/science.1957169"},{"doi-asserted-by":"publisher","key":"ref11","DOI":"10.1016\/0030-4018(95)00119-S"},{"doi-asserted-by":"publisher","key":"ref12","DOI":"10.1016\/S0002-9149(97)89143-6"},{"doi-asserted-by":"publisher","key":"ref13","DOI":"10.1016\/0168-874X(92)90040-J"},{"doi-asserted-by":"publisher","key":"ref14","DOI":"10.1007\/s11517-010-0583-4"},{"doi-asserted-by":"publisher","key":"ref15","DOI":"10.1016\/j.cmpb.2019.105185"},{"doi-asserted-by":"publisher","key":"ref16","DOI":"10.1016\/j.asej.2014.05.010"},{"doi-asserted-by":"publisher","key":"ref17","DOI":"10.1007\/s10439-012-0695-0"},{"doi-asserted-by":"publisher","key":"ref18","DOI":"10.1109\/ICPR.2014.546"},{"doi-asserted-by":"publisher","key":"ref19","DOI":"10.1016\/j.ast.2015.01.030"},{"doi-asserted-by":"publisher","key":"ref20","DOI":"10.1007\/s13244-018-0639-9"},{"doi-asserted-by":"publisher","key":"ref21","DOI":"10.1016\/j.pcad.2006.11.001"},{"doi-asserted-by":"publisher","key":"ref22","DOI":"10.1016\/j.ejrad.2010.07.010"}],"event":{"name":"2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2024,5,20]]},"location":"Glasgow, United Kingdom","end":{"date-parts":[[2024,5,23]]}},"container-title":["2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10560479\/10560519\/10561103.pdf?arnumber=10561103","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,6,30]],"date-time":"2024-06-30T04:20:24Z","timestamp":1719721224000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10561103\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,5,20]]},"references-count":22,"URL":"https:\/\/doi.org\/10.1109\/i2mtc60896.2024.10561103","relation":{},"subject":[],"published":{"date-parts":[[2024,5,20]]}}}