{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,10]],"date-time":"2026-02-10T05:29:31Z","timestamp":1770701371403,"version":"3.49.0"},"reference-count":18,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,5,20]],"date-time":"2024-05-20T00:00:00Z","timestamp":1716163200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,5,20]],"date-time":"2024-05-20T00:00:00Z","timestamp":1716163200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,5,20]]},"DOI":"10.1109\/i2mtc60896.2024.10561156","type":"proceedings-article","created":{"date-parts":[[2024,6,28]],"date-time":"2024-06-28T17:53:14Z","timestamp":1719597194000},"page":"1-5","source":"Crossref","is-referenced-by-count":1,"title":["$1.5-\\mu \\mathrm{m}$ Optical Coherence Tomography for Quality Inspection of 3D-Printed Scattering Phantoms"],"prefix":"10.1109","author":[{"given":"Janne","family":"Lauri","sequence":"first","affiliation":[{"name":"University of Oulu,Optoelectronics and Measurement Techniques Research Unit,Oulu,Finland"}]},{"given":"Tatiana","family":"Avsievich","sequence":"additional","affiliation":[{"name":"University of Oulu,Optoelectronics and Measurement Techniques Research Unit,Oulu,Finland"}]},{"given":"Oleksii","family":"Sieryi","sequence":"additional","affiliation":[{"name":"University of Oulu,Optoelectronics and Measurement Techniques Research Unit,Oulu,Finland"}]},{"given":"Alexander","family":"Bykov","sequence":"additional","affiliation":[{"name":"University of Oulu,Optoelectronics and Measurement Techniques Research Unit,Oulu,Finland"}]},{"given":"Tapio","family":"Fabritius","sequence":"additional","affiliation":[{"name":"University of Oulu,Optoelectronics and Measurement Techniques Research Unit,Oulu,Finland"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1089\/3dp.2013.0010"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1117\/1.JBO.28.8.080903"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1364\/BOE.3.001381"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1118\/1.4962649"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6560\/aad315"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1117\/1.2335429"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.ultras.2021.106353"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/J.ENG.2017.05.013"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/s12008-023-01504-4"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1117\/12.2042266"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1088\/0034-4885\/66\/2\/204"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1117\/1.JBO.24.9.090901"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1117\/1.JBO.28.6.066001"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1088\/2053-1591\/ab11a7"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/s10570-021-03745-6"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.oceram.2022.100311"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1364\/OE.16.019712"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1117\/1.JBO.24.7.070502"}],"event":{"name":"2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","location":"Glasgow, United Kingdom","start":{"date-parts":[[2024,5,20]]},"end":{"date-parts":[[2024,5,23]]}},"container-title":["2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10560479\/10560519\/10561156.pdf?arnumber=10561156","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,6,30]],"date-time":"2024-06-30T04:19:11Z","timestamp":1719721151000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10561156\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,5,20]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/i2mtc60896.2024.10561156","relation":{},"subject":[],"published":{"date-parts":[[2024,5,20]]}}}