{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T01:56:54Z","timestamp":1740103014921,"version":"3.37.3"},"reference-count":59,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,5,20]],"date-time":"2024-05-20T00:00:00Z","timestamp":1716163200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,5,20]],"date-time":"2024-05-20T00:00:00Z","timestamp":1716163200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100004442","name":"National Science Centre, Poland","doi-asserted-by":"publisher","award":["2019\/35\/B\/ST7\/02370"],"award-info":[{"award-number":["2019\/35\/B\/ST7\/02370"]}],"id":[{"id":"10.13039\/501100004442","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,5,20]]},"DOI":"10.1109\/i2mtc60896.2024.10561160","type":"proceedings-article","created":{"date-parts":[[2024,6,28]],"date-time":"2024-06-28T17:53:14Z","timestamp":1719597194000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["Fluctuation-Enhanced Gas Sensing by Two-Dimensional Materials"],"prefix":"10.1109","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-1459-4199","authenticated-orcid":false,"given":"Janusz","family":"Smulko","sequence":"first","affiliation":[{"name":"Gda&#x0144;sk University of Technology,Faculty of Electronics, Telecommunications and Informatics,Gda&#x0144;sk,Poland"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2019.2924112"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1002\/adfm.201702168"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1039\/C5QI00251F"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.3390\/nano8090671"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2012.11.014"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1108\/SR-03-2014-631"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1021\/acssensors.8b01077"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1039\/C9TC04132J"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.3390\/s19061295"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1063\/5.0152456"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1039\/C6NH00192K"},{"article-title":"Noise and nonlinearity of gas sensors\u2013preliminary results","volume-title":"Proc. of 22nd Int. Spring Seminar on Electronics Technology","author":"Dziedzic","key":"ref12"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/S0925-4005(00)00586-4"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1063\/5.0152456"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1002\/smll.201400463"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1021\/acsnano.9b09253"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRev.26.71"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.13.556"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/0375-9601(69)90076-0"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1038\/nnano.2013.144"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2018.2850817"},{"issue":"80","key":"ref22","article-title":"1\/f noise and related surface effects in germanium","volume-title":"Lincoln Laboratory technical report","author":"McWhorter","year":"1955"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1021\/acssensors.2c01511"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1021\/nn202749z"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1039\/D2NR00207H"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/icnf.2017.7985949"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1021\/nn4066473"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1007\/s42823-021-00289-4"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/S1369-7021(12)70045-7"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1021\/acsami.5b01778"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1021\/nl501782e"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1088\/0957-4484\/25\/37\/375703"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-017-02297-3"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1021\/acsnano.0c04192"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1021\/acsnano.2c09733"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1007\/s11082-022-04401-4"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1038\/s41586-019-1013-x"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1039\/C9TC04132J"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1021\/acs.chemmater.5b00153"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2021.131069"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6463\/ac4c55"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2005.05.033"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-023-39701-0"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2016.11.015"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1016\/j.mtcomm.2023.105379"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1021\/acsnano.2c00378"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1142\/S0219477510000277"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1063\/5.0116589"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2013.07.056"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1515\/mms-2015-0039"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1109\/3477.790446"},{"key":"ref52","first-page":"457","article-title":"\u201eNoise measurement setups for fluctuations enhanced gas sensing","volume":"16","author":"Kotarski","year":"2009","journal-title":"Metrology Meas. Syst."},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1016\/j.talanta.2016.06.063"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1109\/ICNF57520.2023.10472774"},{"key":"ref55","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2023.134586"},{"key":"ref56","doi-asserted-by":"publisher","DOI":"10.1155\/2020\/5890402"},{"key":"ref57","doi-asserted-by":"publisher","DOI":"10.1109\/ICSENS.2015.7370360"},{"key":"ref58","doi-asserted-by":"publisher","DOI":"10.1021\/acssensors.3c01185"},{"key":"ref59","doi-asserted-by":"publisher","DOI":"10.1016\/j.snb.2023.133551"}],"event":{"name":"2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2024,5,20]]},"location":"Glasgow, United Kingdom","end":{"date-parts":[[2024,5,23]]}},"container-title":["2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10560479\/10560519\/10561160.pdf?arnumber=10561160","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,6,29]],"date-time":"2024-06-29T05:30:41Z","timestamp":1719639041000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10561160\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,5,20]]},"references-count":59,"URL":"https:\/\/doi.org\/10.1109\/i2mtc60896.2024.10561160","relation":{},"subject":[],"published":{"date-parts":[[2024,5,20]]}}}