{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,28]],"date-time":"2026-02-28T17:47:59Z","timestamp":1772300879876,"version":"3.50.1"},"reference-count":27,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,5,20]],"date-time":"2024-05-20T00:00:00Z","timestamp":1716163200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,5,20]],"date-time":"2024-05-20T00:00:00Z","timestamp":1716163200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,5,20]]},"DOI":"10.1109\/i2mtc60896.2024.10561215","type":"proceedings-article","created":{"date-parts":[[2024,6,28]],"date-time":"2024-06-28T17:53:14Z","timestamp":1719597194000},"page":"1-5","source":"Crossref","is-referenced-by-count":2,"title":["Variable Time Delay Estimation for a Debutanizer Column Using Multiple Correlation Analysis"],"prefix":"10.1109","author":[{"given":"Salvatore","family":"Graziani","sequence":"first","affiliation":[{"name":"Elettronica e Informatica,DIEEI, Dipartimento di Ingegneria Elettrica,Catania,Italy"}]},{"given":"Maria Gabriella","family":"Xibilia","sequence":"additional","affiliation":[{"name":"Dipartimento di Ingegneria,Messina,Italy"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2018.2885609"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.3033153"},{"key":"ref3","volume-title":"Soft sensors for monitoring and control of industrial processes, Advances in Industrial Control","author":"Fortuna","year":"2006"},{"key":"ref4","volume-title":"System identification. Theory for the user","author":"Ljung","year":"1998"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.bej.2021.108048"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.3021047"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2019.8827074"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.conengprac.2017.03.007"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ETFA.2010.5641329"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC50364.2021.9459807"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.compchemeng.2019.02.012"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC48687.2022.9806576"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1177\/1094428106292901"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/MetroXRAINE54828.2022.9967610"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3307748"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/MetroXRAINE58569.2023.10405791"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2019.2929478"},{"key":"ref18","first-page":"310","article-title":"Soft sensor design for variable time delay and variable sampling time","volume-title":"J. Proc. Cont.","volume":"92","author":"Shardt","year":"2020"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3135537"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.conengprac.2004.04.013"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.chemolab.2010.09.008"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1002\/aic.14270"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1002\/cem.2638"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3152856"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.aej.2016.02.016"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2023.3266104"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1080\/10408340500526766"}],"event":{"name":"2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","location":"Glasgow, United Kingdom","start":{"date-parts":[[2024,5,20]]},"end":{"date-parts":[[2024,5,23]]}},"container-title":["2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10560479\/10560519\/10561215.pdf?arnumber=10561215","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,6,30]],"date-time":"2024-06-30T04:22:59Z","timestamp":1719721379000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10561215\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,5,20]]},"references-count":27,"URL":"https:\/\/doi.org\/10.1109\/i2mtc60896.2024.10561215","relation":{},"subject":[],"published":{"date-parts":[[2024,5,20]]}}}