{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,2]],"date-time":"2025-08-02T16:18:54Z","timestamp":1754151534064,"version":"3.41.2"},"reference-count":24,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,5,19]],"date-time":"2025-05-19T00:00:00Z","timestamp":1747612800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,5,19]],"date-time":"2025-05-19T00:00:00Z","timestamp":1747612800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,5,19]]},"DOI":"10.1109\/i2mtc62753.2025.11078947","type":"proceedings-article","created":{"date-parts":[[2025,7,18]],"date-time":"2025-07-18T17:42:33Z","timestamp":1752860553000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["Design and investigation of a Remote Interrogation System for capacitive measurement, exploiting Inkjet Printed techniques"],"prefix":"10.1109","author":[{"given":"Bruno","family":"And\u00f2","sequence":"first","affiliation":[{"name":"University of Catania,DIEEI,Italy"}]},{"given":"Salvatore","family":"Baglio","sequence":"additional","affiliation":[{"name":"University of Catania,DIEEI,Italy"}]},{"given":"Danilo","family":"Greco","sequence":"additional","affiliation":[{"name":"University of Catania,DIEEI,Italy"}]},{"given":"Aruna","family":"Seegobind","sequence":"additional","affiliation":[{"name":"University of Catania,DIEEI,Italy"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2019.2943002"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/access.2023.3309300"},{"issue":"4","key":"ref3","first-page":"543","article-title":"Safety and Reliability in Inductive Coupling Systems","volume":"52","author":"Thomas","journal-title":"IEEE Transactions on Reliability"},{"issue":"3","key":"ref4","first-page":"591","article-title":"Flexible Applications of Inductive Coupling Technology","volume":"59","author":"Munro","year":"2013","journal-title":"IEEE Transactions on Consumer Electronics"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.3390\/proceedings1040395"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2021.3126487"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2017.2708022"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2017.2712190"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2011.2166996"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/access.2023.3309300"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2021.110255"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.3390\/proceedings1040395"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.3390\/bios13060572"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2019.2901004"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/jsen.2021.3085191"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.3390\/bios13060572"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2020.3031157"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/mim.2013.6521134"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/tbcas.2007.913130"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.3390\/electronics10060721"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1063\/5.0147602"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/4.792620"},{"key":"ref23","article-title":"IPC-2221A - Generic Standard on Printed Board Design"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/spec52827.2021.9709449"}],"event":{"name":"2025 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","location":"Chemnitz, Germany","start":{"date-parts":[[2025,5,19]]},"end":{"date-parts":[[2025,5,22]]}},"container-title":["2025 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11078887\/11078930\/11078947.pdf?arnumber=11078947","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,7,19]],"date-time":"2025-07-19T05:02:16Z","timestamp":1752901336000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11078947\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,5,19]]},"references-count":24,"URL":"https:\/\/doi.org\/10.1109\/i2mtc62753.2025.11078947","relation":{},"subject":[],"published":{"date-parts":[[2025,5,19]]}}}