{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,2]],"date-time":"2025-08-02T16:18:37Z","timestamp":1754151517923,"version":"3.41.2"},"reference-count":20,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,5,19]],"date-time":"2025-05-19T00:00:00Z","timestamp":1747612800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,5,19]],"date-time":"2025-05-19T00:00:00Z","timestamp":1747612800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,5,19]]},"DOI":"10.1109\/i2mtc62753.2025.11079010","type":"proceedings-article","created":{"date-parts":[[2025,7,18]],"date-time":"2025-07-18T17:42:33Z","timestamp":1752860553000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["Impulsive Vibrations Detection for Manufacturing Machines Using Machine Learning"],"prefix":"10.1109","author":[{"given":"Boon-Yaik","family":"Ooi","sequence":"first","affiliation":[{"name":"Universiti Teknologi Petronas,Department of Computer &amp; Information Sciences,Malaysia"}]},{"given":"Woan-Lin","family":"Beh","sequence":"additional","affiliation":[{"name":"Universiti Tunku Abdul Rahman,Faculty of Information and Communication Technology,Malaysia"}]},{"given":"Kh\u2019ng Xin","family":"Yi","sequence":"additional","affiliation":[{"name":"Universiti Tunku Abdul Rahman,Faculty of Information and Communication Technology,Malaysia"}]},{"given":"Shervin","family":"Shirmohammadi","sequence":"additional","affiliation":[{"name":"University of Ottawa,Discover Lab,Canada"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.cirpj.2024.05.001"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.3390\/s23010402"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/jiot.2020.2994395"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/sose58276.2023.00017"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ICASSP.2019.8682311"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.isatra.2020.01.019"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2023.3296128"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2022.3175037"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2023.3317928"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2022.3204941"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2023.3272397"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2024.3366570"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2023.3290294"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2022.3174278"},{"key":"ref15","article-title":"N-BEATS: NEURAL BASIS EXPANSION ANALYSIS FOR INTERPRETABLE TIME SERIES FORECASTING","author":"Oreshkin"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2023.110435"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/icpics55264.2022.9873564"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.ins.2024.120316"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/pesgm52003.2023.10253377"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/imcec59810.2024.10575437"}],"event":{"name":"2025 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","location":"Chemnitz, Germany","start":{"date-parts":[[2025,5,19]]},"end":{"date-parts":[[2025,5,22]]}},"container-title":["2025 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11078887\/11078930\/11079010.pdf?arnumber=11079010","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,7,19]],"date-time":"2025-07-19T05:10:19Z","timestamp":1752901819000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11079010\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,5,19]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/i2mtc62753.2025.11079010","relation":{},"subject":[],"published":{"date-parts":[[2025,5,19]]}}}