{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,2]],"date-time":"2025-08-02T16:18:55Z","timestamp":1754151535422,"version":"3.41.2"},"reference-count":16,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,5,19]],"date-time":"2025-05-19T00:00:00Z","timestamp":1747612800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,5,19]],"date-time":"2025-05-19T00:00:00Z","timestamp":1747612800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,5,19]]},"DOI":"10.1109\/i2mtc62753.2025.11079018","type":"proceedings-article","created":{"date-parts":[[2025,7,18]],"date-time":"2025-07-18T17:42:33Z","timestamp":1752860553000},"page":"1-5","source":"Crossref","is-referenced-by-count":0,"title":["A compound fault diagnosis method based on health state feature decoupling"],"prefix":"10.1109","author":[{"given":"Hong","family":"Xu","sequence":"first","affiliation":[{"name":"Xi’an Jiaotong University,School of Mechanical Engineering,Xi’an,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chenye","family":"Hu","sequence":"additional","affiliation":[{"name":"Xi’an Jiaotong University,School of Mechanical Engineering,Xi’an,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yasong","family":"Li","sequence":"additional","affiliation":[{"name":"Xi’an Jiaotong University,School of Mechanical Engineering,Xi’an,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yuangui","family":"Yang","sequence":"additional","affiliation":[{"name":"Xi’an Jiaotong University,School of Mechanical Engineering,Xi’an,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jiaxin","family":"Ren","sequence":"additional","affiliation":[{"name":"Xi’an Jiaotong University,School of Mechanical Engineering,Xi’an,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ruqiang","family":"Yan","sequence":"additional","affiliation":[{"name":"Xi’an Jiaotong University,School of Mechanical Engineering,Xi’an,China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2023.109480"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmsy.2023.10.002"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.37965\/jdmd.2023.152"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2022.109780"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2017.07.038"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1155\/2016\/1248626"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2022.111276"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.3390\/machines10040277"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2022.111433"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2020.108500"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.mechmachtheory.2022.105090"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/cvpr.2016.90"},{"key":"ref13","first-page":"723","article-title":"A kernel two-sample test","volume":"13","author":"Gretton","year":"2012","journal-title":"J. Mach. Learn. Res"},{"key":"ref14","volume-title":"Deep Siamese Domain Adaptation Convolutional Neural Network for Cross-domain Change Detection in Multispectral Images","author":"Chen","year":"2020"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1145\/3065386"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.neunet.2005.06.042"}],"event":{"name":"2025 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","location":"Chemnitz, Germany","start":{"date-parts":[[2025,5,19]]},"end":{"date-parts":[[2025,5,22]]}},"container-title":["2025 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11078887\/11078930\/11079018.pdf?arnumber=11079018","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,7,19]],"date-time":"2025-07-19T05:02:29Z","timestamp":1752901349000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11079018\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,5,19]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/i2mtc62753.2025.11079018","relation":{},"subject":[],"published":{"date-parts":[[2025,5,19]]}}}