{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,2]],"date-time":"2025-08-02T16:18:28Z","timestamp":1754151508550,"version":"3.41.2"},"reference-count":15,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,5,19]],"date-time":"2025-05-19T00:00:00Z","timestamp":1747612800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,5,19]],"date-time":"2025-05-19T00:00:00Z","timestamp":1747612800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100014810","name":"Fondazione di Sardegna","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100014810","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,5,19]]},"DOI":"10.1109\/i2mtc62753.2025.11079032","type":"proceedings-article","created":{"date-parts":[[2025,7,18]],"date-time":"2025-07-18T17:42:33Z","timestamp":1752860553000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["On the Variability of Random Errors Distribution in PMUs: An Experimental Characterization"],"prefix":"10.1109","author":[{"given":"Paolo","family":"Castello","sequence":"first","affiliation":[{"name":"Eng. University of Cagliari,Dept. of Electr. and Electron,Cagliari,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Carlo","family":"Muscas","sequence":"additional","affiliation":[{"name":"Eng. University of Cagliari,Dept. of Electr. and Electron,Cagliari,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Paolo Attilio","family":"Pegoraro","sequence":"additional","affiliation":[{"name":"Eng. University of Cagliari,Dept. of Electr. and Electron,Cagliari,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Davide","family":"Sitzia","sequence":"additional","affiliation":[{"name":"Eng. University of Cagliari,Dept. of Electr. and Electron,Cagliari,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sara","family":"Sulis","sequence":"additional","affiliation":[{"name":"Eng. University of Cagliari,Dept. of Electr. and Electron,Cagliari,Italy"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.3390\/s21186133"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/OJIM.2022.3205678"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRS.2020.2986019"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRS.2021.3093521"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/b978-0-12-804569-5.00005-7"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/AMPS50177.2021.9586044"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/OAJPE.2021.3081503"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRS.2019.2939098"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/CPESE59653.2023.10303218"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2017.2762927"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/PESGM46819.2021.9638135"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.2298\/SJEE2401113C"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC53148.2023.10175893"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2698709"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ieeestd.2018.8577045"}],"event":{"name":"2025 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","location":"Chemnitz, Germany","start":{"date-parts":[[2025,5,19]]},"end":{"date-parts":[[2025,5,22]]}},"container-title":["2025 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11078887\/11078930\/11079032.pdf?arnumber=11079032","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,7,19]],"date-time":"2025-07-19T04:58:07Z","timestamp":1752901087000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11079032\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,5,19]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/i2mtc62753.2025.11079032","relation":{},"subject":[],"published":{"date-parts":[[2025,5,19]]}}}