{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,2]],"date-time":"2025-08-02T16:18:16Z","timestamp":1754151496560,"version":"3.41.2"},"reference-count":23,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,5,19]],"date-time":"2025-05-19T00:00:00Z","timestamp":1747612800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,5,19]],"date-time":"2025-05-19T00:00:00Z","timestamp":1747612800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100006190","name":"Research and Development","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100006190","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,5,19]]},"DOI":"10.1109\/i2mtc62753.2025.11079067","type":"proceedings-article","created":{"date-parts":[[2025,7,18]],"date-time":"2025-07-18T17:42:33Z","timestamp":1752860553000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["T2Net: An Attention-Enhanced Network for Trustworthy Thermal Imaging-Based Lubrication System Condition Assessment"],"prefix":"10.1109","author":[{"given":"Tianlei","family":"Wang","sequence":"first","affiliation":[{"name":"Xi’an Jiaotong University,School of Mechanical Engineering,Xi’an,China"}]},{"given":"Jiaxin","family":"Ren","sequence":"additional","affiliation":[{"name":"Xi’an Jiaotong University,School of Mechanical Engineering,Xi’an,China"}]},{"given":"Ke","family":"Feng","sequence":"additional","affiliation":[{"name":"Xi’an Jiaotong University,School of Mechanical Engineering,Xi’an,China"}]},{"given":"Chenye","family":"Hu","sequence":"additional","affiliation":[{"name":"Xi’an Jiaotong University,School of Mechanical Engineering,Xi’an,China"}]},{"given":"Zhibin","family":"Zhao","sequence":"additional","affiliation":[{"name":"Xi’an Jiaotong University,School of Mechanical Engineering,Xi’an,China"}]},{"given":"Ruqiang","family":"Yan","sequence":"additional","affiliation":[{"name":"Xi’an Jiaotong University,School of Mechanical Engineering,Xi’an,China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2021.3076775"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.inffus.2024.102453"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2019.8826839"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.3390\/s18124113"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2019.8826953"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.engappai.2023.106614"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.patcog.2021.108159"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/tfuzz.2024.3470960"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3330231"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.inffus.2023.01.020"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ICASSP49357.2023.10096516"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmsy.2023.11.006"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/s11263-024-02117-4"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/JAS.2024.124290"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.isatra.2022.07.020"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2019.2938758"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR46437.2021.01350"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.48550\/arXiv.1506.02142"},{"key":"ref19","first-page":"4907","article-title":"Bayesian uncertainty estimation for batch normalized deep networks","volume-title":"international conference on machine learning","volume":"80","author":"Teye"},{"key":"ref20","article-title":"Uncertainty in deep learning","volume-title":"PhD thesis","author":"Gal","year":"2016"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2024.3457938"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00745"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR42600.2020.01155"}],"event":{"name":"2025 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","location":"Chemnitz, Germany","start":{"date-parts":[[2025,5,19]]},"end":{"date-parts":[[2025,5,22]]}},"container-title":["2025 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11078887\/11078930\/11079067.pdf?arnumber=11079067","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,7,19]],"date-time":"2025-07-19T05:06:40Z","timestamp":1752901600000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11079067\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,5,19]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/i2mtc62753.2025.11079067","relation":{},"subject":[],"published":{"date-parts":[[2025,5,19]]}}}