{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,2]],"date-time":"2025-08-02T16:29:56Z","timestamp":1754152196554,"version":"3.41.2"},"reference-count":18,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,5,19]],"date-time":"2025-05-19T00:00:00Z","timestamp":1747612800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,5,19]],"date-time":"2025-05-19T00:00:00Z","timestamp":1747612800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,5,19]]},"DOI":"10.1109\/i2mtc62753.2025.11079079","type":"proceedings-article","created":{"date-parts":[[2025,7,18]],"date-time":"2025-07-18T17:42:33Z","timestamp":1752860553000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["Effect of Different PVDF Thicknesses as Coating on PCB-based Interdigital Capacitance Structure"],"prefix":"10.1109","author":[{"given":"Fatma","family":"Khayat","sequence":"first","affiliation":[{"name":"Centre for Research on Microelectronics and Nanotechnology of Sousse,CRMN,Tunisia"}]},{"given":"Salma","family":"Bizid","sequence":"additional","affiliation":[{"name":"Centre for Research on Microelectronics and Nanotechnology of Sousse,CRMN,Tunisia"}]},{"given":"Mohamed Hadj","family":"Said","sequence":"additional","affiliation":[{"name":"Centre for Research on Microelectronics and Nanotechnology of Sousse,CRMN,Tunisia"}]},{"given":"Mounir","family":"Mansour","sequence":"additional","affiliation":[{"name":"Laboratory of Microelectronics and Instrumentation,Faculty of Sciences of Monastir,Tunisia"}]},{"given":"Fares","family":"Tounsi","sequence":"additional","affiliation":[{"name":"Sfax University,SI2E Laboratory, National Engineering School of Sfax,Tunisia"}]},{"given":"Ayoub Hadj","family":"Said","sequence":"additional","affiliation":[{"name":"Centre for Research on Microelectronics and Nanotechnology of Sousse,CRMN,Tunisia"}]},{"given":"Olfa","family":"Kanoun","sequence":"additional","affiliation":[{"name":"Technische Universität Chemnitz,Measurement and Sensor Technology,Germany"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1080\/03602559.2016.1185630"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.compositesa.2016.04.008"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1155\/2019\/5961563"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1515\/epoly-2015-0131"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2024.3503067"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2022.3210007"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1080\/23080477.2024.2324490"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1111\/jfpe.14265"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.14419\/ijet.v7i4.5.20096"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1080\/14686996.2023.2260301"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2019.111579"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2004.01.040"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.3390\/s150101998"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1002\/pen.25301"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1021\/acs.jpcc.9b00868"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.3390\/nano13061098"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2009.2038026"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1049\/iet-nde.2018.0001"}],"event":{"name":"2025 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","start":{"date-parts":[[2025,5,19]]},"location":"Chemnitz, Germany","end":{"date-parts":[[2025,5,22]]}},"container-title":["2025 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11078887\/11078930\/11079079.pdf?arnumber=11079079","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,7,21]],"date-time":"2025-07-21T18:02:30Z","timestamp":1753120950000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11079079\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,5,19]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/i2mtc62753.2025.11079079","relation":{},"subject":[],"published":{"date-parts":[[2025,5,19]]}}}