{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,2]],"date-time":"2025-08-02T16:18:43Z","timestamp":1754151523708,"version":"3.41.2"},"reference-count":13,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,5,19]],"date-time":"2025-05-19T00:00:00Z","timestamp":1747612800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,5,19]],"date-time":"2025-05-19T00:00:00Z","timestamp":1747612800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,5,19]]},"DOI":"10.1109\/i2mtc62753.2025.11079148","type":"proceedings-article","created":{"date-parts":[[2025,7,18]],"date-time":"2025-07-18T17:42:33Z","timestamp":1752860553000},"page":"1-5","source":"Crossref","is-referenced-by-count":0,"title":["Ultralow-Frequency Noise in High-Bias Precision DC-Coupled Voltage Measurements"],"prefix":"10.1109","author":[{"given":"Novotn\u00fd","family":"David","sequence":"first","affiliation":[{"name":"Czech Technical University in Prague,Faculty of Electrical Engineering,Prague,Czech Republic"}]},{"given":"Jano\u0161ek","family":"Michal","sequence":"additional","affiliation":[{"name":"Czech Technical University in Prague,Faculty of Electrical Engineering,Prague,Czech Republic"}]},{"given":"Vojt\u011bch","family":"Petrucha","sequence":"additional","affiliation":[{"name":"Czech Technical University in Prague,Faculty of Electrical Engineering,Prague,Czech Republic"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/18\/3\/R01"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2017.2688488"},{"key":"ref3","volume-title":"Magnetic sensors and magnetometers","author":"Ripka","year":"2021"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6668\/abd7ce"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/I2MTC.2018.8409543"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM61406.2024.10645831"},{"key":"ref7","volume-title":"An ultra-high-precision voltage reference with low noise and low drift","year":"2023"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1149\/2.F01173if"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/19.106301"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1049\/ep.1966.0328"},{"key":"ref11","volume-title":"Long term characterization of voltage references","author":"Halloin","year":"2013"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1088\/1742-6596\/154\/1\/012027"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.5194\/gi-6-301-2017"}],"event":{"name":"2025 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","location":"Chemnitz, Germany","start":{"date-parts":[[2025,5,19]]},"end":{"date-parts":[[2025,5,22]]}},"container-title":["2025 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11078887\/11078930\/11079148.pdf?arnumber=11079148","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,7,19]],"date-time":"2025-07-19T05:10:59Z","timestamp":1752901859000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11079148\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,5,19]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/i2mtc62753.2025.11079148","relation":{},"subject":[],"published":{"date-parts":[[2025,5,19]]}}}