{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,2]],"date-time":"2025-08-02T16:18:02Z","timestamp":1754151482604,"version":"3.41.2"},"reference-count":23,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,5,19]],"date-time":"2025-05-19T00:00:00Z","timestamp":1747612800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,5,19]],"date-time":"2025-05-19T00:00:00Z","timestamp":1747612800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,5,19]]},"DOI":"10.1109\/i2mtc62753.2025.11079152","type":"proceedings-article","created":{"date-parts":[[2025,7,18]],"date-time":"2025-07-18T17:42:33Z","timestamp":1752860553000},"page":"1-5","source":"Crossref","is-referenced-by-count":0,"title":["A New Measurement Procedure for Digital Sampling-Based Impedance Bridges"],"prefix":"10.1109","author":[{"given":"Krzysztof","family":"Musio\u0142","sequence":"first","affiliation":[{"name":"Silesian University of Technology (SUT),Department of Measurements, Electronics and Control,Gliwice,Poland"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ryszard","family":"Rybski","sequence":"additional","affiliation":[{"name":"University of Zielona G&#x00F3;ra (UZG),Institute of Metrology, Electronics and Computer Science,Zielona G&#x00F3;ra,Poland"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Marian","family":"Kampik","sequence":"additional","affiliation":[{"name":"Silesian University of Technology (SUT),Department of Measurements, Electronics and Control,Gliwice,Poland"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Janusz","family":"Kaczmarek","sequence":"additional","affiliation":[{"name":"University of Zielona G&#x00F3;ra (UZG),Institute of Metrology, Electronics and Computer Science,Zielona G&#x00F3;ra,Poland"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Miros\u0142aw","family":"Kozio\u0142","sequence":"additional","affiliation":[{"name":"University of Zielona G&#x00F3;ra (UZG),Institute of Metrology, Electronics and Computer Science,Zielona G&#x00F3;ra,Poland"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Adam","family":"Zi\u00f3\u0142ek","sequence":"additional","affiliation":[{"name":"Central Office of Measures (GUM),Department of Electricity and Radiation,Warsaw,Poland"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Maciej","family":"Koszarny","sequence":"additional","affiliation":[{"name":"Central Office of Measures (GUM),Department of Electricity and Radiation,Warsaw,Poland"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jolanta","family":"Jursza","sequence":"additional","affiliation":[{"name":"Central Office of Measures (GUM),Department of Electricity and Radiation,Warsaw,Poland"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Pawe\u0142","family":"Zawadzki","sequence":"additional","affiliation":[{"name":"Central Office of Measures (GUM),Department of Electricity and Radiation,Warsaw,Poland"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2010.2100650"},{"key":"ref2","volume-title":"Coaxial Electrical Circuits for Interference-Free measurements (Electrical Measurement)","author":"Awan","year":"2010"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1201\/b13069"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2908649"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2016.7540630"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2790538"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1088\/1681-7575\/aabf24"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1088\/1681-7575\/ab948d"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1088\/1681-7575\/ad2539"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1088\/0026-1394\/53\/4\/1045"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1088\/1681-7575\/aa5ba8"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/abcff3"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM61406.2024.10646139"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1049\/ic:19990102"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/tim.2019.2893715"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2020.108308"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3034115"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1051\/metrology\/201911002"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM.2008.4574920"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2012.2225958"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2022.112159"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/CPEM61406.2024.10646041"},{"key":"ref23","article-title":"Linearity measurement of digitizers used in sampling-based digital impedance bridges by the method of permuting capacitors","volume":"1","author":"Kampik","year":"2024","journal-title":"Metrology&Hallmark"}],"event":{"name":"2025 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)","location":"Chemnitz, Germany","start":{"date-parts":[[2025,5,19]]},"end":{"date-parts":[[2025,5,22]]}},"container-title":["2025 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11078887\/11078930\/11079152.pdf?arnumber=11079152","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,7,19]],"date-time":"2025-07-19T05:04:28Z","timestamp":1752901468000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11079152\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,5,19]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/i2mtc62753.2025.11079152","relation":{},"subject":[],"published":{"date-parts":[[2025,5,19]]}}}