{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T19:01:20Z","timestamp":1725476480134},"reference-count":9,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011,10]]},"DOI":"10.1109\/ias.2011.6074277","type":"proceedings-article","created":{"date-parts":[[2011,11,11]],"date-time":"2011-11-11T18:56:15Z","timestamp":1321037775000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["Characterization of contact discharge between small capacitance devices"],"prefix":"10.1109","author":[{"given":"Yutaka","family":"Soda","sequence":"first","affiliation":[]},{"given":"Tetsuji","family":"Oda","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/20.950947"},{"key":"ref3","doi-asserted-by":"crossref","first-page":"505","DOI":"10.1109\/EOSESD.2000.890130","article-title":"Effect of 1 ns to 250 ms ESD transients on GMR heads","author":"ramaswamy","year":"2000","journal-title":"Electrical Overstress\/Electrostatic Discharge Symposium Proceedings 2000"},{"key":"ref6","first-page":"370","article-title":"Dynamic Temperature Rise of Shielded MR Sensors During Simulated Electrostatic Discharge Pulses of Variable Pulse Width","author":"iben","year":"2004","journal-title":"2004 Electrical Overstress\/Electrostatic Discharge Symposium"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2003.816293"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2006.885896"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2004.829269"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/EOSESD.1998.737057"},{"key":"ref9","first-page":"16","article-title":"Pt-doped A1203 as Dissipative Gap-material in Tape Heads","author":"soda","year":"0","journal-title":"IEEE Industry Applications Magazine"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/20.706602"}],"event":{"name":"2011 IEEE Industry Applications Society Annual Meeting","start":{"date-parts":[[2011,10,9]]},"location":"Orlando, FL, USA","end":{"date-parts":[[2011,10,13]]}},"container-title":["2011 IEEE Industry Applications Society Annual Meeting"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6064644\/6074261\/06074277.pdf?arnumber=6074277","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,20]],"date-time":"2017-06-20T09:33:23Z","timestamp":1497951203000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6074277\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,10]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/ias.2011.6074277","relation":{},"subject":[],"published":{"date-parts":[[2011,10]]}}}