{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T02:36:33Z","timestamp":1729650993776,"version":"3.28.0"},"reference-count":14,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,10]]},"DOI":"10.1109\/ias.2016.7731898","type":"proceedings-article","created":{"date-parts":[[2016,11,3]],"date-time":"2016-11-03T20:38:59Z","timestamp":1478205539000},"page":"1-9","source":"Crossref","is-referenced-by-count":1,"title":["Ageing characterization of colorimetric and photometric properties of commercial LED lamps"],"prefix":"10.1109","author":[{"given":"Zivion O.","family":"Silalahi","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Pascal","family":"Dupuis","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ngapuli I.","family":"Sinisuka","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Laurent","family":"Massol","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Georges","family":"Zissis","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JDT.2015.2448715"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JPHOT.2015.2468679"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ICEMI.2009.5274756"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/EuroSimE.2014.6813802"},{"key":"ref14","doi-asserted-by":"crossref","first-page":"1","DOI":"10.1109\/EuroSimE.2014.6813876","article-title":"Reliability and accelerated test methods for plastic materials in LED-based products","author":"mehr","year":"2014","journal-title":"2014 15th Int Conf Therm Mech Multi-Physics Simul Exp Microelectron Microsystems EuroSimE 2014"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/2944.999189"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1117\/12.512731"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/LPT.2013.2263375"},{"key":"ref5","doi-asserted-by":"crossref","first-page":"233","DOI":"10.1109\/TEPM.2009.2027893","article-title":"Effects of Defects on the Thermal and Optical Performance of High-Brightness Light-Emitting Diodes","volume":"32","author":"tan","year":"2009","journal-title":"IEEE Trans Electron Packag Manuf"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.optmat.2015.03.030"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/LPT.2011.2115997"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/2944.999186"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.3176\/eng.2011.3.05"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.1997.584273"}],"event":{"name":"2016 IEEE Industry Applications Society Annual Meeting","start":{"date-parts":[[2016,10,2]]},"location":"Portland, OR, USA","end":{"date-parts":[[2016,10,6]]}},"container-title":["2016 IEEE Industry Applications Society Annual Meeting"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7636703\/7731809\/07731898.pdf?arnumber=7731898","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,25]],"date-time":"2017-06-25T02:45:17Z","timestamp":1498358717000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7731898\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,10]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/ias.2016.7731898","relation":{},"subject":[],"published":{"date-parts":[[2016,10]]}}}