{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,28]],"date-time":"2025-10-28T15:04:33Z","timestamp":1761663873689,"version":"3.28.0"},"reference-count":28,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,9]]},"DOI":"10.1109\/ias.2018.8544603","type":"proceedings-article","created":{"date-parts":[[2018,12,8]],"date-time":"2018-12-08T00:58:23Z","timestamp":1544230703000},"page":"1-8","source":"Crossref","is-referenced-by-count":7,"title":["Arc Voltage Characteristics of Medium-Low Voltage Arc Fault in Short Gaps"],"prefix":"10.1109","author":[{"given":"Zhenyuan","family":"Zhang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yimin","family":"Nie","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Wei-Jen","family":"Lee","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1002\/etep.4450010111"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1002\/etep.4450040302"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/61.853021"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/PROC.1969.6962"},{"key":"ref14","article-title":"'A new arc parameter database for characterization of short-line fault interruption capability of highvoltage circuit breakers'","author":"smeets","year":"2006","journal-title":"Kema T&D Testing"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1063\/1.1698514"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1149\/1.2429985"},{"journal-title":"Circuit Interruption","year":"1984","author":"browne","key":"ref17"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TCPMT.2018.2791480"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1007\/BF02084317"},{"journal-title":"AC electric arc models for a laboratory set-up and a silicon metal furnace","year":"1996","author":"larsen","key":"ref28"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2014.2339394"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1098\/rspa.1913.0063"},{"journal-title":"IEEE Guide for Performing Arc Flash Hazard Calculations","year":"2002","key":"ref3"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2010.2057497"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/MPE.2014.2322302"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2016.2593687"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2014.2347456"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/28.821823"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2016.2587760"},{"key":"ref1","article-title":"Occupational injuries from electrical shock and arc flash events","author":"cambell","year":"2015","journal-title":"Fire Protection Research Foundation"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1049\/ip-gtd:19949869"},{"key":"ref22","first-page":"371","article-title":"Three dimensional simulation of a DC free burning arc","volume":"91","author":"chemartin","year":"2009","journal-title":"Appl Light Phys Atoms Res"},{"key":"ref21","first-page":"475","article-title":"Fault Arc Modeling in EMTP","author":"sousa","year":"1995","journal-title":"Proc IPST 95"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1007\/s11090-013-9438-8"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TPS.2011.2160208"},{"key":"ref26","article-title":"Code Saturne: A Finite Volume Code for the computation of turbulent incompressible flows-Industrial Applications","volume":"1","author":"archambeau","year":"2004","journal-title":"International Journal on Finite Volumes Institut de Mathématiques de Marseille"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1088\/0022-3727\/24\/1\/006"}],"event":{"name":"2018 IEEE Industry Applications Society Annual Meeting (IAS2018)","start":{"date-parts":[[2018,9,23]]},"location":"Portland, OR","end":{"date-parts":[[2018,9,27]]}},"container-title":["2018 IEEE Industry Applications Society Annual Meeting (IAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8526362\/8544462\/08544603.pdf?arnumber=8544603","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,8,24]],"date-time":"2020-08-24T00:04:23Z","timestamp":1598227463000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8544603\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,9]]},"references-count":28,"URL":"https:\/\/doi.org\/10.1109\/ias.2018.8544603","relation":{},"subject":[],"published":{"date-parts":[[2018,9]]}}}