{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T18:31:53Z","timestamp":1730226713259,"version":"3.28.0"},"reference-count":13,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,9,1]],"date-time":"2019-09-01T00:00:00Z","timestamp":1567296000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,9,1]],"date-time":"2019-09-01T00:00:00Z","timestamp":1567296000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,9,1]],"date-time":"2019-09-01T00:00:00Z","timestamp":1567296000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,9]]},"DOI":"10.1109\/ias.2019.8912349","type":"proceedings-article","created":{"date-parts":[[2019,11,29]],"date-time":"2019-11-29T09:59:46Z","timestamp":1575021586000},"page":"1-5","source":"Crossref","is-referenced-by-count":2,"title":["One-Ended Fault Location Method Based on Machine Learning Models"],"prefix":"10.1109","author":[{"given":"Juan Pablo","family":"Bohorquez","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Gustavo","family":"Ramos","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","first-page":"44","article-title":"Wavelet analysis: theory and applications","volume":"45","author":"lee","year":"1994","journal-title":"Hewlett-Packard Journal"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1155\/2007\/47695"},{"key":"ref12","first-page":"2825","article-title":"Scikit-learn: Machine learning in Python","volume":"12","author":"pedregosa","year":"2011","journal-title":"Journal of Machine Learning Research"},{"journal-title":"EMTP Reference Models for Transmission Line Relay Testing","year":"2005","author":"committee","key":"ref13"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/PESGM.2014.6939019"},{"key":"ref3","first-page":"1","article-title":"An automated model based fault locating method for distribution systems","author":"shi","year":"0","journal-title":"2016 IEEE\/PES Transmission and Distribution Conference and Exposition (T D)"},{"journal-title":"Machine learning model implementation for power systems fault location","year":"2017","author":"boh\u00f3rquez","key":"ref6"},{"key":"ref5","article-title":"Universal model-based fault location for improved system integrity","author":"ananthan","year":"2018","journal-title":"IET Generation Transmission & Distribution"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ICHQP.2016.7783476"},{"key":"ref7","first-page":"1","article-title":"Ieee\/iec measuring relays and protection equipment part 24: Common format for transient data exchange (comtrade) for power systems","year":"2013","journal-title":"IEEE Std C37 111–2013 (IEC 60255–24 Edition 2 0 2013-04)"},{"first-page":"1","article-title":"Ieee guide for determining fault location on ac transmission and distribution lines","year":"2015","key":"ref2"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2014.2323353"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/T-AIEE.1951.5060554"}],"event":{"name":"2019 IEEE Industry Applications Society Annual Meeting","start":{"date-parts":[[2019,9,29]]},"location":"Baltimore, MD, USA","end":{"date-parts":[[2019,10,3]]}},"container-title":["2019 IEEE Industry Applications Society Annual Meeting"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8894477\/8911839\/08912349.pdf?arnumber=8912349","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,15]],"date-time":"2022-07-15T03:09:49Z","timestamp":1657854589000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8912349\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,9]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/ias.2019.8912349","relation":{},"subject":[],"published":{"date-parts":[[2019,9]]}}}