{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T01:40:58Z","timestamp":1725586858563},"reference-count":13,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,10,10]],"date-time":"2020-10-10T00:00:00Z","timestamp":1602288000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,10,10]],"date-time":"2020-10-10T00:00:00Z","timestamp":1602288000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,10,10]],"date-time":"2020-10-10T00:00:00Z","timestamp":1602288000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,10,10]]},"DOI":"10.1109\/ias44978.2020.9334743","type":"proceedings-article","created":{"date-parts":[[2021,2,2]],"date-time":"2021-02-02T21:17:37Z","timestamp":1612300657000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["Confidence Intervals for Luminous Flicker Measurements: Comparison of Various Approaches"],"prefix":"10.1109","author":[{"given":"Leos","family":"Kukacka","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Pascal","family":"Dupuis","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Michal","family":"Vik","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ales","family":"Richter","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Georges","family":"Zissis","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"year":"2017","key":"ref10","article-title":"NI USB 6212 Device Specifications"},{"article-title":"Photodiode with sensitivity close to spectral luminous efficiency","year":"2016","author":"hamamatsu","key":"ref11"},{"year":"0","key":"ref12","article-title":"SLD-70BG2 – Infrared Rejection Filter Planar Photodiode"},{"journal-title":"IEC 61000-3-2 ed 4 2015","article-title":"IEC 61000-3-2 ed.4:2015 Electromagnetic compatibility (EMC) – Part 3-2: Limits – Limits for harmonic current emissions (equipment input current ? 16 A per phase)","year":"2015","key":"ref13"},{"year":"2015","key":"ref4","article-title":"ASSIST Recommends... Recommended Metric for Assessing the Direct Perception of Light Source Flicker"},{"journal-title":"IEC 61547","article-title":"IEC TR 61547-1:2015 Equipment for general lighting purposes – EMC immunity requirements – Part 1: An objective voltage fluctuation immunity test method","year":"2015","key":"ref3"},{"year":"2008","key":"ref6","article-title":"Evaluation of measurement data – Guide to the expression of uncertainty in measurement"},{"key":"ref5","first-page":"1","article-title":"IEEE 1789-2015 IEEE Recommended Practices for Modulating Current in High-Brightness LEDs for Mitigating Health Risks to Viewers","year":"2015","journal-title":"IEEE Std 1789-2015"},{"key":"ref8","article-title":"Establishing Confidence Inter-vals for Luminous Flicker Measurements","author":"kuka?ka","year":"2019","journal-title":"International Conference LIGHT 2019"},{"year":"2008","key":"ref7","article-title":"Evaluation of measurement data – Supplement 1 to the ’Guide to the expression of uncertainty in measurement’ – Propagation of distributions using a Monte Carlo method"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2011.2139270"},{"key":"ref1","first-page":"1","article-title":"IEC 61000-4-15:2010 Electromagnetic compatibility (EMC) – Part 4-15 Testing and measurement techniques – Flickermeter – Functional and design specifications","year":"2010","journal-title":"IEC Std 61000-4-15"},{"year":"2011","author":"salmon","key":"ref9"}],"event":{"name":"2020 IEEE Industry Applications Society Annual Meeting","start":{"date-parts":[[2020,10,10]]},"location":"Detroit, MI, USA","end":{"date-parts":[[2020,10,16]]}},"container-title":["2020 IEEE Industry Applications Society Annual Meeting"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9334688\/9334708\/09334743.pdf?arnumber=9334743","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,28]],"date-time":"2022-06-28T00:16:11Z","timestamp":1656375371000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9334743\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,10,10]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/ias44978.2020.9334743","relation":{},"subject":[],"published":{"date-parts":[[2020,10,10]]}}}