{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T18:21:53Z","timestamp":1730226113264,"version":"3.28.0"},"reference-count":20,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,10,10]],"date-time":"2021-10-10T00:00:00Z","timestamp":1633824000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,10,10]],"date-time":"2021-10-10T00:00:00Z","timestamp":1633824000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,10,10]],"date-time":"2021-10-10T00:00:00Z","timestamp":1633824000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,10,10]]},"DOI":"10.1109\/ias48185.2021.9677157","type":"proceedings-article","created":{"date-parts":[[2022,1,17]],"date-time":"2022-01-17T21:32:23Z","timestamp":1642455143000},"page":"1-7","source":"Crossref","is-referenced-by-count":1,"title":["Novel Approach to Arc Fault Identification with Both Transient and Steady State based Time-Frequency Analysis"],"prefix":"10.1109","author":[{"given":"Zhenyuan","family":"Zhang","sequence":"first","affiliation":[]},{"given":"Jie","family":"Ren","sequence":"additional","affiliation":[]},{"given":"Xiaotian","family":"Tang","sequence":"additional","affiliation":[]},{"given":"Shi","family":"Jing","sequence":"additional","affiliation":[]},{"given":"Wei-Jen","family":"Lee","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TPS.2019.2942630"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2954009"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3062703"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2019.2947858"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2018.2886751"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/EEEIC.2013.6549610"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.dsp.2013.10.008"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2019.2923764"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TCPMT.2020.3043011"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/NPSC49263.2020.9331843"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TPS.2016.2645879"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2020.2981376"},{"key":"ref6","first-page":"1226","article-title":"Extracting the Phase of Fault Currents: A New Approach for Identifying Arc Flash Faults","volume":"52","author":"saleh","year":"2016","journal-title":"IEEE Trans Ind Appl"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ICIEA.2018.8398142"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.3390\/en13010142"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3051669"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MIAS.2019.2943664"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TPS.2016.2645879"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.3390\/electronics9091367"},{"journal-title":"EasyPower LLC","article-title":"Arc Flash Hazard Calculations Using IEEE 1584-2018","year":"0","key":"ref20"}],"event":{"name":"2021 IEEE Industry Applications Society Annual Meeting (IAS)","start":{"date-parts":[[2021,10,10]]},"location":"Vancouver, BC, Canada","end":{"date-parts":[[2021,10,14]]}},"container-title":["2021 IEEE Industry Applications Society Annual Meeting (IAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9677037\/9677038\/09677157.pdf?arnumber=9677157","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T16:57:55Z","timestamp":1652201875000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9677157\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,10,10]]},"references-count":20,"URL":"https:\/\/doi.org\/10.1109\/ias48185.2021.9677157","relation":{},"subject":[],"published":{"date-parts":[[2021,10,10]]}}}