{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,24]],"date-time":"2025-08-24T01:22:51Z","timestamp":1755998571397,"version":"3.28.0"},"reference-count":19,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,10,29]],"date-time":"2023-10-29T00:00:00Z","timestamp":1698537600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,10,29]],"date-time":"2023-10-29T00:00:00Z","timestamp":1698537600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,10,29]]},"DOI":"10.1109\/ias54024.2023.10406615","type":"proceedings-article","created":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T13:27:31Z","timestamp":1706794051000},"page":"1-7","source":"Crossref","is-referenced-by-count":3,"title":["Primary Admittance Based Fault Detection for Inter-Turn Short Circuit in 3-Phase Power Transformers"],"prefix":"10.1109","author":[{"given":"Zhuo","family":"Liu","sequence":"first","affiliation":[{"name":"Shanghai Research Center Rockwell Automation, Inc.,Shanghai,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hao","family":"Yang","sequence":"additional","affiliation":[{"name":"Shanghai Research Center Rockwell Automation, Inc.,Shanghai,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Haihui","family":"Lu","sequence":"additional","affiliation":[{"name":"Shanghai Research Center Rockwell Automation, Inc.,Shanghai,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yujia","family":"Cui","sequence":"additional","affiliation":[{"name":"Intelligent Devices Rockwell Automation, Inc.,Mequon,WI,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kadir","family":"Liano","sequence":"additional","affiliation":[{"name":"Advanced Analytics Rockwell Automation, Inc.,Austin,TX,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zhijun","family":"Liu","sequence":"additional","affiliation":[{"name":"Advanced Analytics Rockwell Automation, Inc.,Austin,TX,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zhongyuan","family":"Cheng","sequence":"additional","affiliation":[{"name":"Intelligent Devices Rockwell Automation, Inc.,Mequon,WI,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Bijan","family":"SayyarRodsari","sequence":"additional","affiliation":[{"name":"Advanced Analytics Rockwell Automation, Inc.,Austin,TX,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/61.871346"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.asoc.2011.05.034"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2020.106602"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1002\/etep.2644"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1049\/iet-gtd.2017.2086"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/61.924821"},{"issue":"2","key":"ref7","first-page":"77","article-title":"Transformer internal winding faults diagnosis methods: A review","volume":"2","author":"Joshi","year":"2912","journal-title":"MIT International Journal of Electrical and Instrumentation Engineering"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/RPIC53795.2021.9648509"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ICEPES52894.2021.9699483"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1515\/jisys-2020-0112"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1049\/hve.2019.0067"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2012.6396941"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2021.107034"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1049\/iet-epa.2016.0059"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2018.2878460"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1007\/s00202-002-0128-4"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/s00202-002-0129-3"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.3390\/en13195231"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.sigpro.2021.108308"}],"event":{"name":"2023 IEEE Industry Applications Society Annual Meeting (IAS)","start":{"date-parts":[[2023,10,29]]},"location":"Nashville, TN, USA","end":{"date-parts":[[2023,11,2]]}},"container-title":["2023 IEEE Industry Applications Society Annual Meeting (IAS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10406298\/10406221\/10406615.pdf?arnumber=10406615","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T19:55:23Z","timestamp":1706817323000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10406615\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,10,29]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/ias54024.2023.10406615","relation":{},"subject":[],"published":{"date-parts":[[2023,10,29]]}}}