{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T03:25:47Z","timestamp":1729653947536,"version":"3.28.0"},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,9]]},"DOI":"10.1109\/icacci.2016.7732220","type":"proceedings-article","created":{"date-parts":[[2016,11,8]],"date-time":"2016-11-08T15:57:45Z","timestamp":1478620665000},"page":"1266-1270","source":"Crossref","is-referenced-by-count":3,"title":["Built in self-test scheme for SRAM memories"],"prefix":"10.1109","author":[{"given":"Abhinav","family":"Sharma","sequence":"first","affiliation":[]},{"given":"V.","family":"Ravi","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","first-page":"103","article-title":"High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test","author":"deans adams","year":"0"},{"key":"ref3","doi-asserted-by":"crossref","first-page":"5931","DOI":"10.15662\/ijareeie.2015.0407018","article-title":"Design of BIST Architecture of 8×8 SRAM Testing using Transient Current Method","volume":"4","author":"jain","year":"2015","journal-title":"International J of Adv Res In Electrical Electronics and Instr Engineering"},{"key":"ref10","article-title":"Implemntation of March Algorithm Based MBIST Architecture for SRAM","volume":"1","author":"radha rani","year":"2012","journal-title":"International Journal of Advanced Research in Computer Engineering & Technology"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ICICDT.2008.4567275"},{"key":"ref5","first-page":"27","article-title":"Implementation of BIST Architecture for Testing SRAM Cell using Dynamic Supply Current","author":"solanki","year":"2014","journal-title":"IRF INTERNATIONALCONFERENCE"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2006.881554"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/CICT.2013.6558115"},{"journal-title":"A thesis presented on “Design and Test of Embedded SRAMs","year":"2005","author":"pavlov","key":"ref2"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.17485\/ijst\/2015\/v8i19\/77006"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2008.2008808"}],"event":{"name":"2016 International Conference on Advances in Computing, Communications and Informatics (ICACCI)","start":{"date-parts":[[2016,9,21]]},"location":"Jaipur, India","end":{"date-parts":[[2016,9,24]]}},"container-title":["2016 International Conference on Advances in Computing, Communications and Informatics (ICACCI)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7592392\/7732013\/07732220.pdf?arnumber=7732220","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,24]],"date-time":"2017-06-24T23:06:20Z","timestamp":1498345580000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7732220\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,9]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/icacci.2016.7732220","relation":{},"subject":[],"published":{"date-parts":[[2016,9]]}}}