{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T09:21:53Z","timestamp":1729675313538,"version":"3.28.0"},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/icarcv.2004.1469295","type":"proceedings-article","created":{"date-parts":[[2005,7,27]],"date-time":"2005-07-27T13:52:28Z","timestamp":1122472348000},"page":"1581-1586","source":"Crossref","is-referenced-by-count":0,"title":["Kinematics modeling and system errors analysis for an AFM based nanomanipulator"],"prefix":"10.1109","volume":"3","author":[{"family":"Xiaojun Tian","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Ning Xi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Yuechao Wang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Zaili Dong","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Wenjung Li","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"13","doi-asserted-by":"publisher","DOI":"10.1088\/0022-3735\/22\/10\/001"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1016\/S0167-9317(03)00157-6"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1063\/1.1146934"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1063\/1.113589"},{"key":"2","doi-asserted-by":"crossref","first-page":"1979","DOI":"10.1126\/science.266.5193.1979","article-title":"Sledtype motion on the nanometer scale: Determination of dissipation and cohesive energies of c60","volume":"266","author":"luthi","year":"1994","journal-title":"Science"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.56.930"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/ACC.2001.946423"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1002\/sca.4950170205"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1116\/1.587266"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1063\/1.1139196"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1063\/1.113809"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1063\/1.1145651"},{"key":"8","first-page":"927","article-title":"Linearity correction systems for the image distortion in atomic force microscope","author":"ito","year":"1994","journal-title":"Proc SICE Ann Conf"}],"event":{"name":"2004 8th International Conference on Control, Automation, Robotics and Vision (ICARCV)","acronym":"ICARCV-04","location":"Kunming, China"},"container-title":["ICARCV 2004 8th Control, Automation, Robotics and Vision Conference, 2004."],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/9908\/31515\/01469295.pdf?arnumber=1469295","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2020,10,14]],"date-time":"2020-10-14T12:01:39Z","timestamp":1602676899000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/1469295"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/icarcv.2004.1469295","relation":{},"subject":[]}}