{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,17]],"date-time":"2026-03-17T18:31:31Z","timestamp":1773772291423,"version":"3.50.1"},"reference-count":23,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,6,4]],"date-time":"2023-06-04T00:00:00Z","timestamp":1685836800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,6,4]],"date-time":"2023-06-04T00:00:00Z","timestamp":1685836800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100007219","name":"Natural Science Foundation of Shanghai","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100007219","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,6,4]]},"DOI":"10.1109\/icassp49357.2023.10096569","type":"proceedings-article","created":{"date-parts":[[2023,5,5]],"date-time":"2023-05-05T17:28:30Z","timestamp":1683307710000},"page":"1-5","source":"Crossref","is-referenced-by-count":15,"title":["Towards Trustworthy Multi-Label Sewer Defect Classification via Evidential Deep Learning"],"prefix":"10.1109","author":[{"given":"Chenyang","family":"Zhao","sequence":"first","affiliation":[{"name":"Southeast University,The College of Software Engineering,Nanjing,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chuanfei","family":"Hu","sequence":"additional","affiliation":[{"name":"University of Shanghai for Science and Technology,School of Optical-Electrical and Computer Engineering,Shanghai,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hang","family":"Shao","sequence":"additional","affiliation":[{"name":"Nanjing University of Science and Technology,School of Computer Science and Engineering,Nanjing,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zhe","family":"Wang","sequence":"additional","affiliation":[{"name":"University of Shanghai for Science and Technology,School of Optical-Electrical and Computer Engineering,Shanghai,China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yongxiong","family":"Wang","sequence":"additional","affiliation":[{"name":"University of Shanghai for Science and Technology,School of Optical-Electrical and Computer Engineering,Shanghai,China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref13","article-title":"Evidential deep learning to quantify classification uncertainty","volume":"31","author":"sensoy","year":"2018","journal-title":"Advances in NIPS"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3250306"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.imavis.2022.104548"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2022.3171983"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-42337-1"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1609\/aaai.v34i07.6909"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.conbuildmat.2022.126584"},{"key":"ref22","first-page":"29074","article-title":"Can multi-label classification networks know what they don’t know?","volume":"34","author":"wang","year":"2021","journal-title":"Advances in NIPS"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.autcon.2019.03.012"},{"key":"ref21","article-title":"Scaling out-of-distribution detection for real-world settings","author":"hendrycks","year":"2019"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2012.05.032"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1080\/15732479.2013.807845"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.patrec.2012.01.004"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ICASSP43922.2022.9746756"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.90"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/WACV48630.2021.00144"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2019.2900170"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ICInfA.2018.8812445"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR46437.2021.01325"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2962437"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2020.3022402"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.aei.2023.101890"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3091498"}],"event":{"name":"ICASSP 2023 - 2023 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP)","location":"Rhodes Island, Greece","start":{"date-parts":[[2023,6,4]]},"end":{"date-parts":[[2023,6,10]]}},"container-title":["ICASSP 2023 - 2023 IEEE International Conference on Acoustics, Speech and Signal Processing (ICASSP)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10094559\/10094560\/10096569.pdf?arnumber=10096569","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,11,13]],"date-time":"2023-11-13T19:00:50Z","timestamp":1699902050000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10096569\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,6,4]]},"references-count":23,"URL":"https:\/\/doi.org\/10.1109\/icassp49357.2023.10096569","relation":{},"subject":[],"published":{"date-parts":[[2023,6,4]]}}}