{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,27]],"date-time":"2025-12-27T07:32:13Z","timestamp":1766820733236},"reference-count":21,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,6,18]],"date-time":"2024-06-18T00:00:00Z","timestamp":1718668800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,6,18]],"date-time":"2024-06-18T00:00:00Z","timestamp":1718668800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001810","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62171285,62327807"],"award-info":[{"award-number":["62171285,62327807"]}],"id":[{"id":"10.13039\/501100001810","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,6,18]]},"DOI":"10.1109\/icca62789.2024.10591867","type":"proceedings-article","created":{"date-parts":[[2024,7,25]],"date-time":"2024-07-25T17:19:13Z","timestamp":1721927953000},"page":"567-572","source":"Crossref","is-referenced-by-count":3,"title":["A Fault-Detection Method of MEMS Micromirrors with Hysteresis *"],"prefix":"10.1109","author":[{"given":"Yonghong","family":"Tan","sequence":"first","affiliation":[{"name":"College of Mechanical and Electronic Engineering, Shanghai Normal University,Shanghai,China,200234"}]},{"given":"Xinyuan","family":"Li","sequence":"additional","affiliation":[{"name":"College of Mechanical and Electronic Engineering, Shanghai Normal University,Shanghai,China,200234"}]},{"given":"Changzhong","family":"Ke","sequence":"additional","affiliation":[{"name":"College of Information Science and Technology, Donghua University,Shanghai,China,201620"}]},{"given":"Ruili","family":"Dong","sequence":"additional","affiliation":[{"name":"College of Information Science and Technology, Donghua University,Shanghai,China,201620"}]},{"given":"Ya","family":"Gu","sequence":"additional","affiliation":[{"name":"College of Mechanical and Electronic Engineering, Shanghai Normal University,Shanghai,China,200234"}]},{"given":"Qingyuan","family":"Tan","sequence":"additional","affiliation":[{"name":"University of Windsor,Dept. of Electrical and Computer Engineering,ON,Canada"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/NEMS.2015.7147502"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1186\/s40486-019-0082-9"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/dtip.2015.7161034"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1117\/12.701266"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2018.2822736"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2005.07.088"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-84800-131-2_58"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.1998.670436"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.2172\/750344"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.ifacol.2016.11.039"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2006.04.012"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2016.07.016"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2020.3013609"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1002\/rnc.4116"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/tfuzz.2021.3050854"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-662-54357-3"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2012.2191291"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2021.3097598"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2016.2542004"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/0022-247X(78)90221-4"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2012.06.069"}],"event":{"name":"2024 IEEE 18th International Conference on Control & Automation (ICCA)","start":{"date-parts":[[2024,6,18]]},"location":"Reykjav\u00edk, Iceland","end":{"date-parts":[[2024,6,21]]}},"container-title":["2024 IEEE 18th International Conference on Control & Automation (ICCA)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10591777\/10591797\/10591867.pdf?arnumber=10591867","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,7,26]],"date-time":"2024-07-26T04:48:59Z","timestamp":1721969339000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10591867\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,6,18]]},"references-count":21,"URL":"https:\/\/doi.org\/10.1109\/icca62789.2024.10591867","relation":{},"subject":[],"published":{"date-parts":[[2024,6,18]]}}}