{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T12:09:34Z","timestamp":1725538174356},"reference-count":18,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/iccad.2003.1257872","type":"proceedings-article","created":{"date-parts":[[2004,5,13]],"date-time":"2004-05-13T10:43:37Z","timestamp":1084445017000},"page":"599-605","source":"Crossref","is-referenced-by-count":1,"title":["Hardware\/software co-testing of embedded memories in complex SOCs"],"prefix":"10.1109","author":[{"family":"Bai Hong Fang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Qiang Xu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"N.","family":"Nicolici","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","article-title":"Power-Constrained Testing of VLSI Circuits","author":"nicolici","year":"2003","journal-title":"Frontiers in Electronic Testing (FRET) Series"},{"journal-title":"PI500 SECT Task Forces IEEE P1500 Web Site","year":"0","key":"ref11"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1999.805773"},{"year":"0","key":"ref13"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/370155.370368"},{"journal-title":"Testing Semiconductor Memories Theory and Practice","year":"1998","author":"van de goor","key":"ref15"},{"key":"ref16","first-page":"356","article-title":"Test Scheduling of BISTed Memory Cores for SOC","author":"wang","year":"2002","journal-title":"Proc IEEE Asian Test Symposium"},{"key":"ref17","doi-asserted-by":"crossref","first-page":"45","DOI":"10.1109\/ATS.2000.893601","article-title":"A Built-In Self-Test and Self-Diagnosis Scheme for Embedded SRA M","author":"wang","year":"2000","journal-title":"Proc IEEE Asian Test Symposium"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/92.953506"},{"journal-title":"Essentials of Electronic Testing","year":"2000","author":"bushnell","key":"ref4"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ETW.2000.873788"},{"journal-title":"Gaisler Research LEON Web Site","year":"0","key":"ref6"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/12.2260"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2002.1011146"},{"journal-title":"The International Technology Roadmap for Semiconductors (ITRS) 2001 Edition","article-title":"International SEMATECH","year":"2001","key":"ref7"},{"journal-title":"AMBA Specification","year":"0","key":"ref2"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2001.990266"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/MTDT.2001.945224"}],"event":{"name":"ICCAD-2003. International Conference on Computer Aided Design","acronym":"ICCAD-03","location":"San Jose, CA, USA"},"container-title":["ICCAD-2003. International Conference on Computer Aided Design (IEEE Cat. No.03CH37486)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8895\/28127\/01257872.pdf?arnumber=1257872","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,16]],"date-time":"2017-06-16T03:02:32Z","timestamp":1497582152000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1257872\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/iccad.2003.1257872","relation":{},"subject":[]}}